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US 10,947,663 B2Granted
Seam inspection device
AssigneeJuki Corporation
InventorsKimiko Fujie, Koji Hiraoka
Life of this patent
Estimating the term…
Abstract
A seam inspection device includes an imaging device and a processing device. The imaging device shoots a sewing object supported by a throat plate of a sewing machine and having seams formed therein. And the processing device detects an abnormality of the seam based on an image of the sewing object acquired by the imaging device.
Claims7
A seam inspection device comprising:
- a camera that shoots a sewing object supported by a throat plate of a sewing machine and having seams formed therein;
- and
- a computer including a memory that stores instructions, and a central processing unit configured to execute the instructions to perform a method including:
- acquiring an image of the sewing object from the camera that shoots the sewing object;
- performing image processing on the acquired image;
- calculating a detected feature amount of the seam, wherein the detected feature amount includes an area defined on a surface of the sewing object by the seams;
- storing a reference feature amount of the seam in a reference feature amount storage unit, wherein the reference feature amount includes an abnormal area greater than a normal area defined on the surface of the sewing object by the seams;
- and
- detecting an abnormality of the seams based on the acquired image of the sewing object by determining whether there is a pattern of abnormality of the seam by collating the detected feature amount with the stored reference feature amount,
- wherein determining whether there is the pattern of abnormality of the at least one seam includes determining whether the abnormality is a third pattern in which a sewing thread becomes slack on the surface of the sewing object.
7 more elements
Dependencies are inferred from the claim text.