# US 10,945,688 B2 · X-ray imaging system and a method of X-ray imaging > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,945,688 B2 - Document ID: US10945688B2 - Status: Granted - Kind: B2 - Application number: 16/177,698 - Filed: 2018-11-01 - Published: 2019-03-07 - Granted: 2021-03-16 - Earliest claimed: 2016-12-05 - Assignees: Shenzhen Xpectvision Technology Co., Ltd. - Applicants: Shenzhen Xpectvision Technology Co., Ltd. - Inventors: Peiyan Cao; Yurun Liu - Web page: https://patentgrep.com/patent/US10945688B2 ## CPC - A61B 6/4266: {characterised by using a plurality of detector units (A61B6/4014 takes precedence)} - A61B 6/032: {Transmission computed tomography [CT]} - A61B 6/4233: {using matrix detectors} - A61B 6/4241: {using energy resolving detectors, e.g. photon counting} - G01T 1/17: Circuit arrangements not adapted to a particular type of detector {(pulse-selection circuits H03K, G01R)} - G01T 1/24: with semiconductor detectors - G01T 1/247: {Detector read-out circuitry (for processing gain or off-set correction H04N)} - G01V 5/22: Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays - G01V 5/222: measuring scattered radiation - A61B: DIAGNOSIS; SURGERY; IDENTIFICATION (usefulness limited to only animals A61D) - G01T: MEASUREMENT OF NUCLEAR OR X-RADIATION (radiation analysis of materials, mass spectrometry G01N23/00; tubes for determining the presence, intensity, density or energy of radiation or particles H01J47/00) - G01V: GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS (means for indicating the location of accidentally buried, e.g. snow-buried, persons A63B29/02) ## Abstract Disclosed herein is an X-ray imaging system suitable for detecting x-ray, comprising: a first X-ray detector, and a second X-ray detector; wherein the first X-ray detector is configured to move relative to the second X-ray detector; wherein a spatial resolution of the first X-ray detector is higher than a spatial resolution of the second X-ray detector; wherein a detection area of the first X-ray detector is smaller than a detection area of the second X-ray detector. Also described herein is a method of X-ray imaging using the X-ray imaging system. ## Claims ### Claim 1 An X-ray imaging system suitable for detecting x-ray, comprising: a first X-ray detector, and a second X-ray detector; wherein the first X-ray detector is configured to move relative to the second X-ray detector; wherein a spatial resolution of the first X-ray detector is higher than a spatial resolution of the second X-ray detector; wherein a detection area of the first X-ray detector is smaller than a detection area of the second X-ray detector; wherein the first X-ray detector comprises: an X-ray absorption layer comprising an electrode; a first voltage comparator configured to compare a voltage of the electrode to a first threshold; a second voltage comparator configured to compare the voltage to a second threshold; a counter configured to register a number of X-ray photons absorbed by the X-ray absorption layer; a controller; wherein the controller is configured to start a time delay from a time at which the first voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold; wherein the controller is configured to activate the second voltage comparator during the time delay; wherein the controller is configured to cause the number registered by the counter to increase by one, if the second voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the second threshold. ### Claim 2 (depends on 1) The X-ray imaging system of claim 1, wherein the first X-ray detector and the second X-ray detector are each capable of forming an image. ### Claim 3 (depends on 1) The X-ray imaging system of claim 1, wherein the first X-ray detector is configured to count photons of X-ray incident thereon. ### Claim 4 (depends on 1) The X-ray imaging system of claim 1, wherein the first X-ray detector is pixelated. ### Claim 5 (depends on 1) The X-ray imaging system of claim 1, wherein the first X-ray detector comprises cadmium telluride (CdTe) or cadmium zinc telluride (CZT). ### Claim 6 (depends on 1) The X-ray imaging system of claim 1, wherein the second X-ray detector comprises a scintillator. ### Claim 7 (depends on 1) The X-ray imaging system of claim 1, comprising an actuator configured to move the first X-ray detector relative to the second X-ray detector in one or more directions; wherein one of the one or more directions is not perpendicular to an imaging plane of the second X-ray detector. ### Claim 8 (depends on 7) The X-ray imaging system of claim 7, wherein the actuator comprises a material that is selected from a group consisting of aluminum, aluminum composite, carbon fiber and a combination thereof. ### Claim 9 (depends on 7) The X-ray imaging system of claim 7, wherein the actuator comprises a robotic arm. ### Claim 10 (depends on 7) The X-ray imaging system of claim 7, wherein the actuator comprises a first rail and a second rail; wherein the first X-ray detector is configured to slide along the first rail; and wherein the first rail is configured to slide along the second rail, wherein the first and second rails are not parallel. ### Claim 11 (depends on 1) The X-ray imaging system of claim 1, wherein the first X-ray detector further comprises a capacitor module electrically connected to the electrode, wherein the capacitor module is configured to collect charge carriers from the electrode. ### Claim 12 (depends on 1) The X-ray imaging system of claim 1, wherein the controller is configured to activate the second voltage comparator at a beginning or expiration of the time delay. ### Claim 13 (depends on 1) The X-ray imaging system of claim 1, wherein the first X-ray detector further comprises a voltmeter, wherein the controller is configured to cause the voltmeter to measure the voltage upon expiration of the time delay. ### Claim 14 (depends on 1) The X-ray imaging system of claim 1, wherein the controller is configured to determine an X-ray photon energy based on a value of the voltage measured upon expiration of the time delay. ### Claim 15 (depends on 1) The X-ray imaging system of claim 1, wherein the controller is configured to connect the electrode to an electrical ground. ### Claim 16 (depends on 1) The X-ray imaging system of claim 1, wherein a rate of change of the voltage is substantially zero at expiration of the time delay. ### Claim 17 (depends on 1) The X-ray imaging system of claim 1, wherein a rate of change of the voltage is substantially non-zero at expiration of the time delay. ### Claim 18 (depends on 1) The X-ray imaging system of claim 1, wherein the X-ray absorption layer comprises a diode. ### Claim 19 (depends on 1) The X-ray imaging system of claim 1, wherein the X-ray absorption layer comprises silicon, germanium, GaAs, CdTe, CdZnTe, or a combination thereof. ### Claim 20 (depends on 1) The X-ray imaging system of claim 1, wherein the first X-ray detector does not comprise a scintillator. ### Claim 21 (depends on 1) A system comprising the X-ray imaging system of claim 1 and an X-ray source, wherein the system is configured to perform X-ray radiography on human chest or abdomen. ### Claim 22 (depends on 1) A system comprising the X-ray imaging system of claim 1 and an X-ray source, wherein the system is configured to perform X-ray radiography on human mouth. ### Claim 23 (depends on 1) A cargo scanning or non-intrusive inspection (NII) system, comprising the X-ray imaging system of claim 1 and an X-ray source, wherein the cargo scanning or non-intrusive inspection (NII) system is configured to form an image using backscattered X-ray. ### Claim 24 (depends on 1) A cargo scanning or non-intrusive inspection (NII) system, comprising the X-ray imaging system of claim 1 and an X-ray source, wherein the cargo scanning or non-intrusive inspection (NII) system is configured to form an image using X-ray transmitted through an object inspected. ### Claim 25 (depends on 1) A full-body scanner system comprising the X-ray imaging system of claim 1 and an X-ray source. ### Claim 26 (depends on 1) An X-ray computed tomography (X-ray CT) system comprising the X-ray imaging system of claim 1 and an X-ray source. ### Claim 27 (depends on 1) An electron microscope comprising the X-ray imaging system of claim 1, an electron source and an electronic optical system. ### Claim 28 (depends on 1) A system comprising the X-ray imaging system of claim 1, wherein the system is an X-ray telescope, or an X-ray microscopy, or wherein the system is configured to perform mammography, industrial defect detection, microradiography, casting inspection, weld inspection, or digital subtraction angiography. ### Claim 29 A method of X-ray imaging using an X-ray imaging system, wherein the X-ray imaging system comprises: a first X-ray detector, and a second X-ray detector; wherein the first X-ray detector is configured to move relative to the second X-ray detector; wherein a spatial resolution of the first X-ray detector is higher than a spatial resolution of the second X-ray detector; wherein a detection area of the first X-ray detector is smaller than a detection area of the second X-ray detector; wherein the first X-ray detector comprises: an X-ray absorption layer comprising an electrode; a first voltage comparator configured to compare a voltage of the electrode to a first threshold; a second voltage comparator configured to compare the voltage to a second threshold; a counter configured to register a number of X-ray photons absorbed by the X-ray absorption layer; a controller; wherein the controller is configured to start a time delay from a time at which the first voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold; wherein the controller is configured to activate the second voltage comparator during the time delay; wherein the controller is configured to cause the number registered by the counter to increase by one, if the second voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the second threshold; the method comprising: taking a first image of an object with the second X-ray detector; determining an area of interest of the object based on the first image; and taking a second image of the area of interest with the first X-ray detector. ### Claim 30 (depends on 29) The method of claim 29, comprising: moving the first X-ray detector to a position suitable to take an image of the area of interest before taking the second image. ### Claim 31 (depends on 29) The method of claim 29, comprising: making a composite image by combining the first image and the second image. ### Claim 32 (depends on 29) The X-ray imaging system of claim 29, wherein the first X-ray detector is configured to overlay the second X-ray detector while the first X-ray detector moves. ### Claim 33 (depends on 29) The method of claim 29, further comprising moving the first X-ray detector to the area of interest, wherein the first X-ray detector overlays the second X-ray detector while the first X-ray detector is moved.