Appearance inspection system, image processing device, setting device, and inspection method
AssigneeOMRON Corporation
InventorsShingo Inazumi, Yutaka Kato, Naoya Nakashita
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AssigneeOMRON Corporation
InventorsShingo Inazumi, Yutaka Kato, Naoya Nakashita
Estimating the term…
An appearance inspection system enabling a route to be easily set when a target is imaged while causing a relative position of an imaging device with respect to the target to be different is provided. A decision part decides a plurality of relative position candidates of the imaging device with respect to the target at which focus of a lens module is possible on the inspection target position with regard to each of a plurality of the inspection target positions on the target. A selection part selects relative positions one by one from corresponding plurality of relative position candidates for each of the plurality of inspection target positions and selects a route candidate satisfying a preset requirement from a plurality of route candidates generated by sequentially connecting the plurality of selected relative positions as a designation route.
An appearance inspection system that performs appearance inspection by imaging a target using an imaging device while causing a relative position of the imaging device with respect to the target to be different along a designation route,
An inspection method of performing appearance inspection by imaging a target using an imaging device while causing a relative position of the imaging device with respect to the target to be different along a designation route,
Dependencies are inferred from the claim text.