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US 10,908,598 B1Granted
Integrated circuits designed for multiple sets of criteria
AssigneeXilinx, Inc.
InventorPraful Jain
Life of this patent
Estimating the term…
Abstract
Examples described herein provide a method for designing an integrated circuit (IC) for meeting different sets of criteria. In an example, different sets of criteria are identified for an IC design. The IC design is designed to meet the different sets of criteria based on expected manufacturing variation. The IC design is caused to be manufactured as IC products. At least some of the IC products are caused to be tested. The IC products are characterized as meeting respective ones of the different sets of criteria based on testing the at least some of the IC products.
Claims17
A method comprising:
- identifying different specifications for an integrated circuit (IC) design, each specification of the different specifications including a same group of criteria categories, each specification of the different specifications having a different criterion for at least one criteria category of the group of criteria categories relative to each other specification of the different specifications, each specification of the different specifications corresponding to a use application different from a respective use application of each other specification of the different specifications;
- designing the IC design to meet the different specifications based on expected manufacturing variation;
- causing the IC design to be manufactured as IC products;
- causing at least some of the IC products to be tested;
- and
- characterizing the IC products as meeting respective ones of the different specifications based on testing the at least some of the IC products.
3 more elements
A method comprising:
- providing historical data related to one or more manufacturing processes;
- manufacturing integrated circuit (IC) products based on an IC design using the one or more manufacturing processes, wherein the IC design is designed based on an expected manufacturing variation to meet different specifications, each specification of the different specifications including a same group of criteria categories, each specification of the different specifications having a different criterion for at least one criteria category of the group of criteria categories relative to each other specification of the different specifications, each specification of the different specifications corresponding to a use application different from a respective use application of each other specification of the different specifications, the expected manufacturing variation being derived from a statistical analysis of the historical data;
- and
- testing at least some of the IC products to obtain test results, wherein the IC products are capable of being characterized for respective ones of the different specifications based on the test results.
1 more element
A method comprising:
- performing a statistical analysis of data obtained for one or more manufacturing processes to generate expected manufacturing variation;
- creating an integrated circuit (IC) design to meet different specifications based on the expected manufacturing variation, each specification of the different specifications including a same group of criteria categories, each specification of the different specifications having a different criterion for at least one criteria category of the group of criteria categories relative to each other specification of the different specifications, each specification of the different specifications corresponding to a use application different from a respective use application of each other specification of the different specifications, creating the IC design including determining whether the IC design is expected to meet the different specifications comprising simulating the IC design using the expected manufacturing variation;
- manufacturing IC products based on the IC design and using the one or more manufacturing processes;
- performing testing to determine characteristics of the IC products;
- and
- characterizing the IC products to meet respective ones of the different specifications based on the characteristics.
3 more elements
Dependencies are inferred from the claim text.