Shield box, shield box assembly and apparatus for testing a semiconductor device
AssigneeAdvanced Semiconductor Engineering Korea, Inc.
InventorsHyun Yang, Yanghoon Kim
Life of this patent
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Abstract
A shield box includes a top portion, a bottom portion and a socket. The top portion defines an aperture and includes at least one first ridge and at least one first groove. The bottom portion includes at least one second ridge and at least one second groove. The first ridge of the top portion occupies a second space defined by the second groove of the bottom portion, and the second ridge of the bottom portion occupies a first space defined by the first groove of the top portion. The socket is disposed over the bottom portion and accessible through the aperture of the top portion.
Claims19
A shield box, comprising:
- a top portion defining an aperture and including at least one first ridge and at least one first groove;
- a bottom portion including at least one second ridge and at least one second groove, wherein the first ridge of the top portion occupies a second space defined by the second groove of the bottom portion, and the second ridge of the bottom portion occupies a first space defined by the first groove of the top portion;
- a socket disposed over the bottom portion and accessible through the aperture of the top portion;
- and a work press including at least one protrusion portion corresponding to the aperture;
- wherein the top portion contacts the socket, and the top portion further includes at least one third ridge and at least one third groove on an upper side of the top portion, the work press further includes at least one fourth ridge and at least one fourth groove, wherein the fourth ridge of the work press corresponds to the third groove of the top portion, and the fourth groove of the work press corresponds to the third ridge of the top portion.
An apparatus for testing a semiconductor device, comprising:
- a shielding curtain;
- a shield box disposed in a space enclosed by the shielding curtain, and comprising:
- a top portion defining an aperture and including at least one first ridge and at least one first groove on a lower side of the top portion;
- a bottom portion including at least one second ridge and at least one second groove, wherein the first ridge of the top portion corresponds to the second groove of the bottom portion, and the first groove of the top portion corresponds to the second ridge of the bottom portion;
- a test board interposed between the top portion and the bottom portion;
- and
- a socket mounted on the test board for receiving the semiconductor device accessible through the aperture of the top portion;
- a work press including at least one protrusion portion corresponding to the aperture;
- a signal source configured to emit a test signal to the semiconductor device;
- and
- a signal receiver configured to receive a result signal from the semiconductor device,
- wherein the protrusion portion of the work press contacts the socket, and the top portion further includes at least one third ridge and at least one third groove on an upper side of the top portion, the work press further includes at least one fourth ridge and at least one fourth groove, wherein the fourth ridge of the work press corresponds to the third groove of the top portion, and the fourth groove of the work press corresponds to the third ridge of the top portion.
Dependencies are inferred from the claim text.