Integrated wireless communication test environment
AssigneeOctoscope Inc.
InventorsLeigh Chinitz, Fanny Mlinarsky
Life of this patent
Estimating the term…
Abstract
An apparatus for testing electromagnetic components includes electromagnetically-isolating external walls that define a chamber. An internal wall is attached to one or more of the electromagnetically-isolating external walls to form an internal test instrument chamber and an internal device testing chamber. An internal RF feed-through port passes through the internal wall to electrically couple a test instrument disposed in the internal test instrument chamber to a wireless device-under-test (DUT) disposed in the internal device testing chamber. One or more external RF feed-through ports can pass through one of the electromagnetically-isolating external walls to electrically couple the DUT and/or the test instrument to a second wireless device.
Claims32
An apparatus for testing wireless devices, comprising:
- electromagnetically-isolating external walls that define a chamber;
- an internal wall attached to one or more of the electromagnetically-isolating external walls to form an internal test instrument chamber and an internal device testing chamber;
- and
- an internal RF feed-through port that passes through the internal wall to electrically couple a test instrument disposed in the internal test instrument chamber to a wireless device-under-test (DUT) disposed in the internal device testing chamber,
- wherein the test instrument is electrically coupled to an external RF feed-through port that passes through one of the electromagnetically-isolating external walls on a perimeter of the internal test instrument chamber to electrically couple the test instrument to a second wireless device.
A system for testing wireless devices, comprising:
- a first apparatus comprising:
- first electromagnetically-isolating external walls that define a first chamber;
- an internal wall attached to one or more of the first electromagnetically-isolating external walls to form an internal test instrument chamber and an internal device testing chamber;
- an internal wall RF feed-through port that passes through the internal wall to electrically couple a test instrument disposed in the internal test instrument chamber to a first wireless device disposed in the internal device testing chamber;
- and
- a first external wall RF feed-through port that passes through one of the electromagnetically-isolating external walls on a perimeter of the internal test instrument chamber;
- a second apparatus comprising:
- second electromagnetically-isolating external walls that define a second chamber;
- and
- a second external wall RF feed-through port that passes through one of the second electromagnetically-isolating external walls, wherein:
- the test instrument is in electrical communication with the first wireless device via the internal wall RF feed-through port, and
- the test instrument is in electrical communication with a second wireless device in the second chamber via the first and second external wall RF feed-through ports.
A method of wireless device testing comprising:
- placing a first wireless device in a chamber having electromagnetically-isolating external walls;
- placing a testing device in the chamber;
- testing a wireless device-under-test (DUT), wherein the DUT is in electrical communication with the first wireless device or the DUT comprises the first wireless device;
- collecting test data with the testing device, the test data corresponding to wireless signals sent to and/or from the first wireless device during the testing;
- and
- placing the testing device in an internal test instrument chamber defined by an internal wall attached to one or more of the electromagnetically-isolating external walls.
Dependencies are inferred from the claim text.