Airgap vertical transistor without structural collapse
AssigneeInternational Business Machines Corporation
InventorsKangguo Cheng, Chanro Park, Juntao Li, Ruilong Xie
Life of this patent
Estimating the term…
Loading patent…
AssigneeInternational Business Machines Corporation
InventorsKangguo Cheng, Chanro Park, Juntao Li, Ruilong Xie
Estimating the term…
Embodiments of the present invention are directed to forming an airgap-based vertical field effect transistor (VFET) without structural collapse. A dielectric collar anchors the structure while forming the airgaps. In a non-limiting embodiment of the invention, a vertical transistor is formed over a substrate. The vertical transistor can include a fin, a top spacer, a top source/drain (S/D) on the fin, and a contact on the top S/D. A dielectric layer is recessed below a top surface of the top spacer and a dielectric collar is formed on the recessed surface of the dielectric layer. Portions of the dielectric layer are removed to form a first cavity and a second cavity. A first airgap is formed in the first cavity and a second airgap is formed in the second cavity. The dielectric collar anchors the top S/D to the top spacer while forming the first airgap and the second airgap.
A method for forming a semiconductor device, the method comprising:
A method for forming a semiconductor device, the method comprising:
Dependencies are inferred from the claim text.