Analysis data processing method and device
AssigneeShimadzu Corporation
InventorsMasahiro Ikegami, Shigeki Kajihara
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AssigneeShimadzu Corporation
InventorsMasahiro Ikegami, Shigeki Kajihara
Estimating the term…
When conducting imaging mass analysis for a region to be measured on a sample, an individual reference value calculating part obtains a maximum value in Pi/Ii of respective measuring points, and stores the value together with measured data as an individual reference value. When performing comparison analysis for a plurality of the data obtained from different samples, a common reference value determining part reads out corresponding a plurality of the individual reference values and determines a minimum value as a common reference value Fmin. A normalization calculation processing part normalizes the respective intensity values by multiplying the intensity values read out from an external memory device by a normalization coefficient long_Max×(Fmin/Pi) obtained from the common reference value Fmin, TIC values Pi at the respective measuring points, and a maximum allowable value long_Max of a variable storing the intensity values at the time of operation.
An analytical data processing method that handles a spectrum data set including spectrum data collected by performing predetermined analyses respectively on a plurality of measuring points in a predetermined region to be measured set on a sample and indicating a relationship between a predetermined parameter and a signal intensity value, being associated with spatial position information of the measuring points, the method comprising:
An analytical data processing method that handles a spectrum data set including spectrum data collected by performing predetermined analyses respectively on a plurality of measuring points in a predetermined region to be measured set on a sample and indicating a relationship between a predetermined parameter and a signal intensity value, being associated with spatial position information of the measuring points, the method comprising:
An analytical data processing apparatus that handles a spectrum data set including spectrum data collected by performing predetermined analyses respectively on a plurality of measuring points in a predetermined region to be measured set on a sample and indicating a relationship between a predetermined parameter and a signal intensity value, being associated with spatial position information of the measuring points, the apparatus comprising:
An analytical data processing apparatus that handles a spectrum data set including spectrum data collected by performing predetermined analyses respectively on a plurality of measuring points in a predetermined region to be measured set on a sample and indicating a relationship between a predetermined parameter and a signal intensity value, being associated with spatial position information of the measuring points, the apparatus comprising:
An analytical data processing method that handles data including spectrum data collected by performing predetermined analyses respectively on a plurality of measuring points in a predetermined region to be measured set on a sample and indicating a relationship between a predetermined parameter and a signal intensity value, being associated with spatial position information of the measuring points, the method comprising:
An analytical data processing apparatus that handles data including spectrum data collected by performing predetermined analyses respectively on a plurality of measuring points in a predetermined region to be measured set on a sample and indicating a relationship between a predetermined parameter and a signal intensity value, being associated with spatial position information of the measuring points, the apparatus comprising:
An analytical data processing method that handles data including spectrum data collected by performing predetermined analyses respectively on a plurality of measuring points in a predetermined region to be measured set on a sample and indicating a relationship between a predetermined parameter and a signal intensity value, being associated with spatial position information of the measuring points, the method comprising:
An analytical data processing apparatus that handles a data including spectrum data collected by performing predetermined analyses respectively on a plurality of measuring points in a predetermined region to be measured set on a sample and indicating a relationship between a predetermined parameter and a signal intensity value, being associated with spatial position information of the measuring points, the apparatus comprising:
Dependencies are inferred from the claim text.