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US 10,896,704 B2Granted
Apparatus with a calibration mechanism
AssigneeMicron Technology, Inc.
InventorsJason M. Johnson, Jung-Hwa Choi
Life of this patent
Estimating the term…
Abstract
An apparatus includes: a master die; one or more slave dies; a ZQ resister between a first node and a second node coupled to a voltage terminal; a ZQ pad coupled to each of the first node of the ZQ resister, the master die and the one or more slave dies; and a calibration channel electrically coupling the master die and the one or more slave dies, the calibration channel configured to communicate signals between the master die and the one or more slave dies for coordinating access to the ZQ pad across the master die and the one or more slave dies.
Claims20
An apparatus, comprising:
- a master die;
- one or more slave dies;
- a ZQ resister between a first node and a second node coupled to a voltage terminal;
- a ZQ pad coupled to each of the first node of the ZQ resister, the master die and the one or more slave dies;
- and
- a calibration channel electrically coupling the master die and the one or more slave dies, the calibration channel configured to communicate signals between the master die and the one or more slave dies for coordinating access to the ZQ pad across the master die and the one or more slave dies.
3 more elements
An apparatus, comprising:
- a master die;
- one or more slave dies;
- a ZQ pad coupled to each of the master die and the one or more slave dies, the ZQ pad configured to provide a reference resistance level for a ZQ calibration process that tunes one or more resistance levels associated with output signal at a corresponding one of the master die and the one or more slave dies;
- and
- a calibration channel electrically coupling the master die and the one or more slave dies, the calibration channel configured to communicate signals between the master die and the one or more slave dies for coordinating access to the ZQ pad across the master die and the one or more slave dies in implementing the ZQ calibration process.
2 more elements
Dependencies are inferred from the claim text.