Method, and storage medium and also device for carrying out same
AssigneeInfineon Technologies AG
InventorsAndreas Martin, Daniel Beckmeier
Life of this patent
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Abstract
A method for the computer-aided characterization of a circuit comprising a semiconductor layer and a semiconductor component region embedded in the semiconductor layer in an electrically insulated manner, wherein the semiconductor component region is optionally coupled to a dielectric layer structure to be protected, the method comprising determining an indication representing vis-à-vis the semiconductor layer an intensity of an electrical charging of the semiconductor component region by a production process used to produce the circuit, wherein a physical construction of the semiconductor component region is taken into account when determining the indication, and classifying the semiconductor component region taking account of the indication.
Claims28
A method for computer-aided characterization of a circuit comprising a semiconductor layer and a semiconductor component region embedded in the semiconductor layer in an electrically insulated manner, the method comprising:
- obtaining a circuit model of the circuit;
- using the circuit model, determining an indication representing an intensity of an electrical charging of the semiconductor component region by a production process used to produce the circuit with respect to the semiconductor layer, wherein a physical construction of the semiconductor component region is taken into account when determining the indication;
- classifying the semiconductor component region taking account of the indication, including at least one electrical charging jeopardized classification in a first iteration of the method;
- and
- adapting the circuit model to generate an adapted circuit model on the basis of a result of the classifying including the at least one electrical charging jeopardized classification.
Dependencies are inferred from the claim text.