Apparatus and method for de-embedding a combiner from a balanced signal
AssigneeTektronix, Inc.
InventorsJohn J. Pickerd, Pirooz Hojabri, Kan Tan
Life of this patent
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AssigneeTektronix, Inc.
InventorsJohn J. Pickerd, Pirooz Hojabri, Kan Tan
Estimating the term…
A test and measurement system including a plurality of channels and one or more processors. The one or more processors are configured to cause the test and measurement system to receive, via a first channel of the plurality of channels, a positive side of a reference differential signal pair, receive, via a second channel of the plurality of channels, a negative side of the reference differential signal pair, and produce a reference signal based the reference differential signal pair. A combined signal is received, from a combiner, that is a balanced signal produced from the reference differential signal pair. A de-embed filter is generated based on the reference signal and the combined signal and an additional signal is received from the combiner and an effect of the combiner is removed from the additional signal by applying the de-embed filter to the additional signal.
A test and measurement system comprising:
A method of de-embedding a combiner from an acquired signal received from a device under test, comprising:
One or more computer readable storage media having instructions stored thereon that, when executed by a processor of a test and measurement instrument, cause the test and measurement instrument to:
Dependencies are inferred from the claim text.