Sample preparing apparatus, sample preparing system, sample preparing method, and particle analyzer
AssigneeSysmex Corporation
InventorDavid Buschke
Life of this patent
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AssigneeSysmex Corporation
InventorDavid Buschke
Estimating the term…
To accurately analyze measurement target particles in each specimen, while reducing variation in dispensing amounts of specimens which is caused by different viscosities of the respective specimens. A sample preparing apparatus 1 includes: a measurement section 2 configured to measure a specimen obtained from a specimen container 10, and obtain viscosity information relating to viscosity of the specimen; a sample preparation section 3 configured to prepare a measurement sample by aspirating the specimen from the specimen container 10, discharging the specimen into a mixing container 11, and mixing the specimen with a labeling substance in the mixing container 11; and a control section 4 configured to determine, on the basis of viscosity information, at least one of an aspiration condition for aspirating the specimen and a discharge condition for discharging the specimen, and control the sample preparation section 3.
A sample preparing apparatus comprising:
A sample preparing system comprising:
A particle analyzer comprising:
Dependencies are inferred from the claim text.