Device, program, recording medium, and method for determining device normality and abnormality involving loads
AssigneeNippon Yusen Kabushiki Kaisha
InventorsTakashi Mishima, Kanefumi Uematsu, Masahiro Shibaoka, Hiroshi Nakatani, Tomoo Oishi, Masayuki Kozuka
Life of this patent
Estimating the term…