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US 10,894,234 B2Granted
Zeolite membrane having AFX structure, membrane structure, and method for manufacturing membrane structure
AssigneeNGK Insultators, Ltd.
InventorsTakeshi Hagio, Kenichi Noda, Makoto Miyahara, Katsuya Shimizu
Life of this patent
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Abstract
A peak intensity of a (004) plane is greater than or equal to 3 times a peak intensity of a (110) plane in an X-ray diffraction pattern obtained by irradiation of X-rays to a membrane surface of an AFX membrane.
Claims7
A zeolite membrane having an AFX structure, wherein
- a peak intensity of a (004) plane is greater than or equal to 3 times a peak intensity of a (110) plane in an X-ray diffraction pattern obtained by irradiation of X-rays to a membrane surface of the zeolite membrane.
A method for manufacturing a membrane structure, comprising:
- attaching plate-shaped seed crystals having an AFX structure to a surface of a porous support;
- and
- immersing the porous support into a starting material solution and performing hydrothermal synthesis, wherein
- the plate-shaped seed crystals having an AFX structure are arranged side-by-side on the surface of the porous support in the step of attaching the plate-shaped seed crystals having an AFX structure to the surface of the porous support.
1 more element
Dependencies are inferred from the claim text.