Wafer debonding system and method
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChang-Chen Tsao, Kuo Liang Lu, Ru-Liang Lee, Sheng-Hsiang Chuang, Yu-Hung Cheng, Yeur-Luen Tu, Cheng-Kang Hu
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChang-Chen Tsao, Kuo Liang Lu, Ru-Liang Lee, Sheng-Hsiang Chuang, Yu-Hung Cheng, Yeur-Luen Tu, Cheng-Kang Hu
Estimating the term…
The present disclosure relates to a debonding apparatus. In some embodiments, the debonding apparatus comprises a wafer chuck configured to hold a pair of bonded substrates on a chuck top surface. The debonding apparatus further comprises a pair of separating blades including a first separating blade and a second separating blade placed at edges of the pair of bonded substrates. The first separating blade has a first thickness that is smaller than a second thickness of the second separating blade. The debonding apparatus further comprises a flex wafer assembly configured to pull the pair of bonded substrates upwardly to separate a second substrate from a first substrate of the pair of bonded substrate. By providing unbalanced initial torques on opposite sides of the bonded substrate pair, edge defects and wafer breakage are reduced.
A debonding apparatus for debonding a pair of bonded substrates, comprising:
A debonding apparatus for debonding a pair of bonded substrates, comprising:
A debonding apparatus for debonding a pair of bonded substrates, comprising:
Dependencies are inferred from the claim text.