Data storage apparatus and internal voltage trimming circuit and method for trimming an internal voltage

An internal voltage trimming circuit configured to provide a trimming code for generating an internal voltage of a semiconductor device, wherein the internal voltage trimming circuit comprises:

• an integration circuit configured to generate an integration signal by integrating a difference between a test voltage output from a device under test (DUT) and a reference voltage;
• a comparison circuit configured to generate a comparison signal by comparing the integration signal and the reference voltage;
• a transition detection circuit configured to output a detection signal in response to level transition of the comparison signal;
• a counter configured to receive an initial trimming code and generate a preliminary trimming code by increasing or reducing the initial trimming code in response to the detection signal;
• and
• an average circuit configured to generate a final trimming code by averaging the preliminary trimming code for a determined time interval and provide the final trimming code to the semiconductor device.

A trimming method performed by an internal voltage trimming to circuit for generating an internal voltage of a semiconductor device, the method comprising:

• generating an integration signal by integrating a difference between a test voltage output from a device under test (DUT) and a reference voltage;
• generating a comparison signal by comparing the integration signal and the reference voltage;
• outputting a detection signal in response to level transition of the comparison signal;
• generating a preliminary trimming code by increasing or reducing an initial trimming code in response to the detection signal;
• and
• generating a final trimming code by averaging the preliminary trimming code for a determined time interval and providing the final trimming code to the semiconductor device.