Probe socket

A probe socket with a plurality of signal probes for testing electric characteristics of an object, the probe socket comprising:

• a conductive noise shielding body configured to accommodate the plurality of signal probes therein to be parallel with one another while exposing opposite ends of the signal probes from the conductive noise shielding body, and shield noise between the plurality of signal probes;
• upper and lower conductive noise shielding walls respectively protruded from upper and lower surfaces of the noise shielding body to a predetermined height and extended laterally to block a predetermined area between the exposed opposite ends of the plurality of signal probes;
• and
• upper and lower holding members respectively coupled to top and bottom sides of the noise shielding body, and configured to support the exposed opposite ends of the plurality of signal probes, and comprising noise shielding walls accommodating grooves for accommodating the conductive noise shielding walls thereto, respectively,
• wherein the upper and lower holding members each comprises signal probe holding holes configured to hold the signal probes protruded from the upper and lower surfaces of the noise shielding body at predetermined locations.