US 10,884,045 B2 · Test arrangement and test method

Abstract

Device and method for analyzing a probe, in particular for analyzing a symmetrical, differential probe. A ground-based test signal is provided to a main signal line, wherein the main signal line is terminated by a predetermined impedance. Furthermore, at least one additional signal line is provided, wherein a further impedance is arranged between the additional signal line and the ground. Accordingly, a differential probe may measure a differential signal between the main signal line and the additional signal line. Hence, no grounded signal is provided to the probe. This measurement of the probe can be compared with a reference signal directly acquired on the main signal line. In this way, characteristic values such as impedance and/or frequency response of the probe can be determined.

Claims14

Dependent claims

A test device for analyzing a symmetric probe, the test device comprising:

a main signal line connectable to a first terminal of the symmetric probe, the main signal line comprises a test signal source interface, electrically connected to a first end of the main signal line and adapted to receive a test signal, and a first impedance, adapted to terminate a second end of the main signal line;
at least one symmetrical signal line, each symmetrical signal line being a further signal line connectable to a second terminal of the symmetric probe, each symmetrical signal line comprising a second impedance, adapted to terminate a first end of the respective symmetrical signal line;
and
a dielectric support substrate, wherein the main signal line and the at least one symmetrical signal line are electrically conductive structures arranged on the dielectric support substrate.

1 more element

Dependencies are inferred from the claim text.

Test arrangement and test method

Life of this patent

Test arrangement and test method

Life of this patent

Abstract

Claims14