Test socket unit

A test socket unit for testing electrical properties of a test circuit device, the test socket unit configured to be locked to a test substrate of the test circuit device for testing, the test socket unit comprising:

• a plurality of support locking pins configured to be stationarily installed on the surface of the test substrate, each said support locking pin protruding upward from the surface of the test substrate and comprising a locking engaging portion and a locking stopper at an end portion along a protruding direction;
• a socket main body configured to support a plurality of probes for signal transmission and comprising a plurality of pin through holes through which the support locking pins are inserted;
• a floating plate comprising a plurality of pin guide holes to which the support locking pins are inserted, the floating plate coupled to a top surface of the socket main body while being vertically floated to a predetermined height from the socket main body;
• at least one elastic member interposed in between the socket main body and the floating plate;
• and
• at least one locking member placed adjacent to the floating plate, the locking member comprising a locking portion of semicircular or grooved shape configured to be selectively engaged with the locking engaging portion and prevented from separating upward by the locking stopper when the locking portion is coupled to the floating plate, and be movable so that the locking portion is to be selectively locked to and unlocked from the locking engaging portion in a state that the floating plate is elastically pressed against the socket main body.