Resin film, barrier film, and electrically conductive film, and production methods therefor
AssigneeZeon Corporation
InventorToshihide Murakami
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Abstract
A resin film formed of a resin containing a polymer containing an alicyclic structure and having crystallizability, wherein a crystallization degree of the polymer is 30% or more, and a thickness variation Tv of the resin film represented by the following formula (1) is 5% or less. The formula (1) is Tv [%]=[(Tmax−Tmin)/Tave]×100. In the formula (1), Tmax is a maximum value of the thickness of the resin film, Tmin is a minimum value of the thickness of the resin film, and Tave is an average value of the thickness of the resin film).
Claims11
A resin film formed of a resin containing a polymer containing an alicyclic structure and having crystallizability, wherein
- a crystallization degree of the polymer is 30% or more, and
- a thickness variation Tv of the resin film represented by the following formula (1) is 5% or less:
- Tv [%]=[(Tmax−Tmin)/Tave]×100 (1),
- (in the formula (1),
- Tmax is a maximum value of the thickness of the resin film,
- Tmin is a minimum value of the thickness of the resin film, and
- Tave is an average value of the thickness of the resin film).
Dependencies are inferred from the claim text.