One-port surface elastic wave resonator on high permittivity substrate

A measurement system for interrogating a surface elastic wave resonator circuit comprising:

• interrogation means operating in a band of frequencies located between all of the following frequencies:
• 400 MHz and 450 MHz, 900 MHz and 950 MHz, and 850 MHz and 900 MHz;
• and
• a surface elastic wave resonator circuit comprising:
• at least one surface elastic wave resonator;
• and
• at least one load impedance;
• the at least one surface elastic wave resonator configured as a one-port surface elastic wave resonator and comprising:
• a piezoelectric material configured to propagate surface elastic waves;
• and
• at least one transducer inserted between a pair of reflectors, said at least one transducer comprising combs of interdigitated electrodes and said at least one transducer having a number Nc of the interdigitated electrodes, the interdigitated electrodes are connected to a hot spot and the interdigitated electrodes are configured to have an acoustic aperture W,
• wherein a product of Nc·W/fa for said at least one transducer being greater than 100 μm·MHz−1, where fa is an antiresonance frequency of said resonator;
• wherein the at least one surface elastic wave resonator having an electrical response manifesting as a peak in a coefficient of reflection S11 at a frequency characterized by a minimum value of a parameter S11 that is at least lower than −10 dB with a phase rotation greater than 1200;
• wherein the at least one surface elastic wave resonator is configured as a remotely interrogable passive sensor;
• and
• wherein the at least one surface elastic wave resonator is configured to operate in antiresonance and the at least one surface elastic wave resonator is configured such that an antiresonance peak of said resonator is matched to the at least one load impedance.