# US 10,874,013 B2 · Ion beam target assemblies for neutron generation

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- Number: US 10,874,013 B2
- Document ID: US10874013B2
- Status: Granted
- Kind: B2
- Application number: 16/430,839
- Filed: 2019-06-04
- Published: 2019-12-12
- Granted: 2020-12-22
- Earliest claimed: 2018-06-06
- Assignees: Phoenix Neutron Imaging LLC
- Applicants: Phoenix Neutron Imaging LLC
- Inventors: Ross Radel; Tye Gribb
- Web page: https://patentgrep.com/patent/US10874013B2

## CPC

- H05H 6/00: Targets for producing nuclear reactions (supports for targets or objects to be irradiated G21K5/08 {; preparation of tritium C01B4/00; targets, e.g. pellets for fusion reactions by laser or charged particles beam injection H05H1/22})
- H05H 3/06: Generating neutron beams (targets for producing nuclear reactions H05H6/00; neutron sources G21G4/02)
- Y02E 30/10: Nuclear fusion reactors
- H05H: PLASMA TECHNIQUE (apparatus or processes specially adapted for producing X-rays H05G2/00); PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- Y02E: REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION

## Abstract

Provided herein are systems, devices, articles of manufacture, and methods for generating neutrons employing a high energy ion beam target (HEIB target) and a target backing configured to be in contact with the bottom surface of the HEIB target (e.g., to generate an ion beam target assembly). In certain embodiments, the HEIB target has a thickness that is less than the penetration depth of protons or deuterons in the high energy ion beam that strikes the target. In certain embodiments, the target backing comprises a high hydrogen diffusion metal (e.g., palladium), has open spaces dispersed throughout for reduced proton diffusion distances, and has a shape and thickness such that all, or virtually all, of the protons or deuterons that pass through the HEIB target are stopped. Also provided herein are systems, devices, and methods for changing targets in an ion beam accelerator system.

## Claims

### Claim 1

A system comprising:
a) a high energy ion beam target (HEIB target) comprising a metal and having a top surface and a bottom surface,
wherein said metal is selected from the group consisting of: beryllium, uranium, lithium, tungsten, and tantalum,
wherein said high energy ion beam comprises protons and/or deuterons,
wherein said HEIB target generates neutrons when exposed to a high energy ion beam, and
wherein said HEIB target has a thickness between said top and bottom surfaces that is less than the penetration depth of protons or deuterons in said high energy ion beam; and
b) a target backing comprising a high hydrogen diffusion metal (HHDM),
wherein said target backing has open spaces dispersed throughout such that the proton or deuteron diffusion distance is reduced throughout said target backing compared to if said target backing was a solid piece without said open spaces,
wherein said target backing is configured to be positioned in contact with said bottom surface of said HEIB target, and
wherein said target backing has a shape and thickness such that all, or virtually all, of said protons and/or deuterons in said higher energy ion beam that pass through said HEIB target are stopped by said target backing when it is positioned in contact with said HEIB target.

### Claim 2 (depends on 1)

The system of claim 1, wherein said open spaces are selected from: pores, grooves, holes, corrugations, channels, open cells, honeycomb cells, irregular openings, or any combination thereof.

### Claim 3 (depends on 1)

The system of claim 1, wherein said target backing is attached to, or configured to be attached to, said bottom surface of said HEIB target by brazing, welding, soldering, diffusion, or bonding.

### Claim 4 (depends on 1)

The system of claim 1, further comprising: c) a cooled substrate.

### Claim 5 (depends on 4)

The system of claim 4, wherein said target backing is attached to, or configured to be attached to, said cooled substrate.

### Claim 6 (depends on 1)

The system of claim 1, wherein said HEIB target comprises: i) a first layer comprising said metal, and ii) a second layer comprising a metal different than used in said first layer selected from the group consisting of: beryllium, uranium, lithium, tungsten, and tantalum.

### Claim 7 (depends on 4)

The system of claim 4, wherein said cooled substrate comprises copper and/or aluminum.

### Claim 8 (depends on 1)

The system of claim 1, wherein said HEIB target has a thickness between 2 mm and 25 mm, and a diameter between 25 mm and 150 mm.

### Claim 9 (depends on 1)

The system of claim 1, wherein said thickness of said target backing is between 2 mm and 10 mm.

### Claim 10

An article of manufacture comprising: a) an ion beam target assembly, wherein said ion target beam assembly comprises:
i) a high energy ion beam target (HEIB target) comprising metal and having a top surface and a bottom surface,
wherein said metal is selected from the group consisting of: beryllium, uranium, lithium, tungsten, and tantalum,
wherein said high energy ion beam comprises protons and/or deuterons,
wherein said HEIB target generates neutrons when exposed to a high energy ion beam, and
wherein said HEIB target has a thickness between said top and bottom surfaces that is less than the penetration depth of protons or deuterons in said high energy ion beam; and
ii) a target backing comprising a high hydrogen diffusion metal (HHDM),
wherein said target backing has open spaces dispersed throughout such that the proton or deuteron diffusion distance is reduced throughout said target backing compared to if said target backing was a solid piece without said open spaces,
wherein said target backing is attached to said bottom surface of said HEIB target, and
wherein said target backing has a shape and thickness such that all, or virtually all, of said protons or deuterons in said higher energy ion beam that pass through said HEIB target are stopped by said target backing.

### Claim 11 (depends on 10)

The system of claim 10, wherein said open spaces are selected from: pores, grooves, holes, corrugations, channels, open cells, honeycomb cells, irregular openings, or any combination thereof.

### Claim 12 (depends on 10)

The system of claim 10, wherein said target backing is attached to said bottom surface of said HEIB target by brazing, soldering, welding, or diffusion bonding.

### Claim 13 (depends on 10)

The system of claim 10, further comprising: b) a cooled substrate.

### Claim 14 (depends on 13)

The system of claim 13, wherein said cooled substrate comprises copper and/or aluminum.

### Claim 15 (depends on 10)

The system of claim 10, wherein said HEIB target comprises: i) a first layer comprising said metal, and ii) a second layer comprising a metal different than used in said first layer selected from the group consisting of: beryllium, uranium, lithium, tungsten, and tantalum.

### Claim 16 (depends on 10)

The system of claim 10, wherein said HEIB target has a thickness between 2 mm and 25 mm, and a diameter between 25 mm and 150 mm.

### Claim 17 (depends on 10)

The system of claim 10, wherein said thickness of said target backing is between 2 mm and 10 mm.

### Claim 18 (depends on 10)

The system of claim 10, wherein target backing comprises a core of solid vanadium that is coated with a thin film of palladium.

### Claim 19 (depends on 10)

The system of claim 10, wherein at least 95% of said HEIB target is said metal.

### Claim 20 (depends on 1)

A system comprising:
a) an ion source configured to produce an ion beam;
b) an accelerator operatively coupled to said ion source and configured to receive said ion beam and accelerate said ion beam to generate an accelerated ion beam;
c) a target chamber configured to receive said accelerated ion beam; and
d) a target changing mechanism, wherein said target changing mechanism is configured to:
i) hold a plurality of targets, wherein each target is the target of claim 1, and wherein each target when struck with said accelerated ion beam in said target chamber generates neutrons,
ii) hold one of said plurality of targets in a first position that is inside said target chamber and is in the path of said accelerated ion beam, while holding the remaining targets outside said target chamber, and
iii) move the target in said first position to a position outside said target chamber, and move one of said remaining targets into said first position inside said target chamber.