# US 10,872,744 B2 · Charged particle beam apparatus > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,872,744 B2 - Document ID: US10872744B2 - Status: Granted - Kind: B2 - Application number: 16/310,333 - Filed: 2016-06-17 - Published: 2019-05-16 - Granted: 2020-12-22 - Earliest claimed: 2016-06-17 - Assignees: Hitachi High-Tech Corporation - Applicants: Hitachi High-Tech Corporation - Inventors: Munekazu Koyanagi; Wataru Suzuki; Toshihide Agemura - Web page: https://patentgrep.com/patent/US10872744B2 ## CPC - H01J 37/20: Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support - H01J 37/22: Optical {, image processing} or photographic arrangements associated with the tube - H01J 37/226: {Optical arrangements for illuminating the object; optical arrangements for collecting light from the object} - H01J 37/26: Electron or ion microscopes; Electron or ion diffraction tubes - H01J 37/265: {Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided, e.g. bright-field-dark-field illumination} - H01J 37/28: with scanning beams {(H01J37/268, H01J37/292, H01J37/2955 take precedence)} - H01J 2237/2002: Controlling environment of sample - H01J 2237/202: Movement - H01J 2237/20285: computer-controlled - H01J 2237/20292: Means for position and/or orientation registration - H01J 2237/31745: for preparing specimen to be viewed in microscopes or analyzed in microanalysers - H01J: ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; electric arc lamps H05B31/00; particle accelerators H05H) ## Abstract In a charged particle beam apparatus is provided with an optical image capturing apparatus having an angle different from that of a column, a sample may collide with other components when the sample is faced toward the optical image capturing apparatus. The charged particle beam apparatus includes a stage configured to place a sample thereon and to move the sample inside a sample chamber; a column configured to observe the sample by irradiating a charged particle beam on the sample; a first image capturing apparatus configured to observe a surface of the sample irradiated with the charged particle beam from an angle different from that of the column; and a control unit configured to, when observing the sample via the first image capturing apparatus, separate the sample from the column and to tilt the sample through the stage to face toward the first image capturing apparatus. ## Claims ### Claim 1 A charged particle beam apparatus comprising: a stage configured to place a sample thereon and to move the sample inside a sample chamber; a column of a scanning electron microscope configured to irradiate a charged particle beam on the sample by outputting the charged particle beam in a direction perpendicular to an upper surface of the stage; a first image capturing apparatus configured to observe a surface of the sample irradiated with the charged particle beam from an angle different from that of the column and obtain an optical image of the sample; and a control unit configured to, when observing the sample via the first image capturing apparatus, separate the sample from the column by moving the sample in a vertical direction away from the column and, subsequently, to tilt the sample through the stage to face toward the first image capturing apparatus; wherein the control unit corrects a magnification and coordinates of the first image capturing apparatus according to a position of the sample when observing the sample by using the first image capturing apparatus. ### Claim 2 (depends on 1) The charged particle beam apparatus according to claim 1, further comprising: a second image capturing apparatus configured to observe a side surface of the sample; and a display unit, wherein the control unit displays an image obtained by the second image capturing apparatus on the display unit when the sample faces toward the first image capturing apparatus. ### Claim 3 (depends on 1) The charged particle beam apparatus according to claim 1, further comprising: a second image capturing apparatus configured to observe a side surface of the sample, wherein the control unit determines the possibility of collision between the sample and other components based on an image obtained by the second image capturing apparatus when the sample faces toward the first image capturing apparatus. ### Claim 4 (depends on 3) The charged particle beam apparatus according to claim 3, wherein the control unit controls the movement of the sample by the stage so as to further separate the sample from the first image capturing apparatus when it is determined that the possibility of collision between the sample and other components is high. ### Claim 5 (depends on 1) The charged particle beam apparatus according to claim 1, wherein when the sample is larger than the field of view of the first image capturing apparatus, the control unit observes the sample by the first image capturing apparatus while rotating the sample by using the stage. ### Claim 6 A method of observing a sample comprising: irradiating the sample in a first position with a charged particle beam from a column of a scanning electron microscope by outputting the charged particle beam in a direction perpendicular to an upper surface of a stage on which the sample is located; obtaining an optical image of a surface of the sample irradiated with the charged particle beam by a first image capturing apparatus provided in a direction different from that of the column with respect to the sample; separating the sample from the column by moving the sample in a vertical direction away from the column and, subsequently, tilting the sample to a second position different from the first position such that the sample faces toward the first image capturing apparatus; observing the sample in the second position by the first image capturing apparatus; and correcting a magnification and coordinates of the first image capturing apparatus according to a position of the sample when observing the sample by using the first image capturing apparatus. ### Claim 7 (depends on 6) The method of observing a sample according to claim 6, wherein a side surface of the sample is observed by a second image capturing apparatus, and in order to observe the sample by the first image capturing apparatus, an image obtained by the second image capturing apparatus is displayed on a display unit when the sample faces toward the first image capturing apparatus. ### Claim 8 (depends on 6) The method of observing a sample according to claim 6, wherein a side surface of the sample is observed by a second image capturing apparatus, and when the sample faces toward the first image capturing apparatus, the possibility of collision between the sample and other components is determined from an image obtained by the second image capturing apparatus. ### Claim 9 (depends on 8) The method of observing a sample according to claim 8, wherein when it is determined that the possibility of collision between the sample and other components is high, the sample is further separated from the first image capturing apparatus. ### Claim 10 (depends on 6) The method of observing a sample according to claim 6, wherein when the sample is larger than the field of view of the first image capturing apparatus, the sample is observed by using the first image capturing apparatus while rotating the sample.