Numerical controller
AssigneeFanuc Corporation
InventorsNorihito Ebato, Kazuo Sato, Takahiko Endo
Life of this patent
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Abstract
A numerical controller that detects occurrence of an abnormality according to a neighborhood method includes a sampling value acquisition unit configured to collect sampling values indicative of a state of a machine or environment, wherein the sampling values are collected during normal machining and during operation; a learning unit configured to generate a set of the sampling values during the normal machining; and an abnormality degree determination unit configured to compute an abnormality degree on the basis of a distance between the sampling value during the operation and the set of the sampling values during the normal machining.
Claims5
A numerical controller detecting occurrence of an abnormality using a neighborhood method, the numerical controller comprising:
- a processor configured to:
- collect sampling values indicative of a state of a machine or environment, wherein the sampling values are collected during a normal machining mode and during an operation mode;
- generate a set of the sampling values collected during the normal machining mode;
- and
- compute an abnormality degree on the basis of a two-dimensional distance between the sampling values collected during the operation mode and the set of the sampling values collected during the normal machining mode,
- wherein during the computation of the abnormality degree the processor is configured to:
- define an approximation area constituted by a small square enclosing each set of the sampling values generated during the normal machining mode,
- enclose the sampling values collected during the operation mode in another small square, and
- compute the abnormality degree on the basis of a length of a side of the another small square enclosing the sampling values during the operation mode and a side of the small square in contact with each other.
Dependencies are inferred from the claim text.