# US 10,871,508 B1 · Nonlinear transmission line (NLTL)-based miniature reflectometers with reduced heat dissipation and scalable tether length > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,871,508 B1 - Document ID: US10871508B1 - Status: Granted - Kind: B1 - Application number: 16/024,788 - Filed: 2018-06-30 - Granted: 2020-12-22 - Earliest claimed: 2017-06-30 - Assignees: Anritsu Corporation - Applicants: Anritsu Company - Inventors: Thomas Roberts; Karam Noujeim - Web page: https://patentgrep.com/patent/US10871508B1 ## CPC - G01R 1/24: Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section - G01R 27/28: Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response (in line transmission systems H04B3/46) - G01R 1/0416: {Connectors, terminals (G01R1/0425 and G01R1/0433 take precedence; with measurement function for battery poles G01R31/364)} - G01R 23/20: Measurement of non-linear distortion - G01R 27/06: Measuring reflection coefficients; Measuring standing-wave ratio - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract A system for measuring an electrical response of a device under test (DUT) includes a reflectometer with reduced heat dissipation used with a vector network analyzer (VNA). The reflectometer is tethered to the VNA using a tether of scalable length which carries low frequencies. The reflectometer has a distributed harmonic generator including a non-linear transmission line (NLTL) for multiplying a frequency of an RF signal received from the VNA to generate a test signal having a frequency in the millimeter wave range at a test port connected to the DUT. A sampler in the reflectometer receives a local oscillator (LO) signal from the VNA and includes another NLTL for receiving the LO signal and generating pulses at a frequency in the millimeter wave range. When the test signal is transmitted to the DUT, the sampler outputs intermediate frequency signals which are transmitted to the VNA for characterization of the DUT. ## Claims ### Claim 1 A system comprising a reflectometer, for measuring an electrical response of a device under test (DUT), the reflectometer module comprising: an input port for connecting the reflectometer module via a tether to a radio frequency (RF) source and receiving a radio frequency (RF) signal; a test port for connecting the reflectometer to a device under test (DUT); a distributed harmonic generator connected to the input port, wherein the RF signal from the input drives the distributed harmonic generator to multiply the RF signal and generate a test signal having a frequency in the millimeter wave range; an amplifier connected to the distributed harmonic generator and configured to amplify the test signal generated by the distributed harmonic generator; a signal path connecting the amplifier to the output port, wherein the amplifier provides the amplified test signal through the signal path to the output port; a sampler coupled to the signal path, wherein the sampler comprises, a sampler input connectable with an local oscillator (LO) source to receive a LO signal, a non-linear transmission line (NLTL) for receiving the LO signal and generating pulses at a frequency in the millimeter wave range, wherein the sampler is configured to receive an input signal from the DUT in response to the test signal, wherein the response signal is in the millimeter wave range, wherein the sampler is configured to generate an intermediate frequency (IF) signal from the response signal using the pulse generated by the NLTL, and wherein the sampler outputs the IF an signal via the tether to a receiver of a measuring instrument. ### Claim 2 (depends on 1) The system of claim 1, further comprising: a tether connectable between the reflectometer module and a measuring instrument to carry the LO signal and the RF signal from the measuring instrument to the reflectometer module and carry the IF signal from the reflectometer module to the measuring instrument. ### Claim 3 (depends on 2) The system of claim 2, further comprising: a vector network analyzer (VNA) connectable with the reflectometer module at a port via the tether and providing an RF signal to the reflectometer module; and wherein the VNA includes an amplifier stage for amplifying the RF signal prior to transmitting the RF signal at the port. ### Claim 4 A system for measuring an electrical response of a device under test (DUT), comprising: a vector network analyzer (VNA) having a radio frequency source, a receiver, and a port for transmitting RF signal; a reflectometer module with reduced heat dissipation, the reflectometer module being connectable with the VNA and including an input port for connecting the reflectometer module via a tether to the radio frequency (RF) source and receiving the radio frequency (RF) signal from the VNA, a test port for connecting the reflectometer module to the DUT, a distributed harmonic generator connected to the input port, wherein the RF signal from the input drives the distributed harmonic generator to multiply the RF signal and generate a test signal having a frequency in the millimeter wave range, an amplifier connected to the distributed harmonic generator and configured to amplify the test signal generated by the distributed harmonic generator, a signal path connecting the amplifier to the output port, wherein the amplifier provides the amplified test signal through the signal path to the output port, a sampler coupled to the signal path, wherein the sampler comprises, a sampler input connectable with an local oscillator (LO) source to receive a LO signal, a non-linear transmission line (NLTL) for receiving the LO signal and generating pulses at a frequency in the millimeter wave range, wherein the sampler is configured to receive an input signal from the DUT in response to the test signal, wherein the response signal is in the millimeter wave range, wherein the sampler is configured to generate an intermediate frequency (IF) signal from the response signal using the pulse generated by the NLTL, and wherein the sampler outputs the IF signal via the tether to the receiver of the VNA; a tether for connecting the reflectometer module to the VNA via the port to carry the LO signal and the RF signal from the VNA to the reflectometer module and the IF signal from the reflectometer module to the VNA. ### Claim 5 (depends on 4) The system of claim 4, wherein the VNA comprises an amplifier stage for amplifying the RF signal prior to transmitting the RF signal to the reflectometer module. ### Claim 6 (depends on 4) The system of claim 4, wherein the VNA comprises an amplifier stage for amplifying the RF signal prior to transmitting the RF signal to the reflectometer module in order to compensate for signal losses in tethers having different lengths. ### Claim 7 (depends on 4) The system of claim 4, wherein the VNA comprises a thermally managed amplifier stage for amplifying the RF signal prior to transmitting the RF signal to the reflectometer module. ### Claim 8 (depends on 4) The system of claim 4, wherein the VNA comprises amplifier stage for amplifying the RF signal in a narrowband frequency range of the reflectometer module prior to transmitting the RF signal to the reflectometer module whereby the amplified RF signal can be transmitted over a longer length of tether while having sufficient power at the reflectometer module to generate test signals for transmission to the DUT. ### Claim 9 (depends on 4) The system of claim 4, wherein the tether is fiver meters long and the VNA comprises amplifier stage for amplifying the RF signal in a narrowband frequency range of the reflectometer module prior to transmitting the RF signal to the reflectometer module whereby the amplified RF signal can be transmitted over the five meter long tether while having sufficient power at the reflectometer module to generate test signals for transmission to the DUT. ### Claim 10 A system for measuring an electrical response of a device under test (DUT), comprising: a vector network analyzer (VNA) having a radio frequency source, a LO source for transmitting a LO signal, a receiver, and a port for transmitting an RF signal; a reflectometer module; a tether which connects the reflectometer module to the VNA to carry the LO signal and the RF signal from the VNA to the reflectometer module and an IF signal from the reflectometer module to the VNA; wherein the reflectometer module comprises, an input port for connecting the reflectometer module via a tether to the radio frequency (RF) source and receiving the radio frequency (RF) signal from the VNA, a test port for connecting the reflectometer module to the DUT, a distributed harmonic generator connected to the input port, wherein the RF signal from the input drives the distributed harmonic generator to multiply the RF signal and generate a test signal having a frequency in the millimeter wave range, an amplifier connected to the distributed harmonic generator and configured to amplify the test signal generated by the distributed harmonic generator, a signal path connecting the amplifier to the output port, wherein the amplifier provides the amplified test signal through the signal path to the output port, a sampler coupled to the signal path, wherein the sampler comprises, a sampler input connectable with an local oscillator (LO) source to receive a LO signal, a non-linear transmission line (NLTL) for receiving the LO signal and generating pulses at a frequency in the millimeter wave range, wherein the sampler is configured to receive an input signal from the DUT in response to the test signal, wherein the response signal is in the millimeter wave range, wherein the sampler is configured to generate an intermediate frequency (IF) signal from the response signal using the pulse generated by the NLTL, and wherein the sampler outputs the IF signal via the tether to the receiver of the VNA. ### Claim 11 (depends on 10) The system of claim 10, wherein the VNA comprises an amplifier stage for amplifying the RF signal prior to transmitting the RF signal to the reflectometer module. ### Claim 12 (depends on 10) The system of claim 10, wherein the VNA comprises an amplifier stage for amplifying the RF signal prior to transmitting the RF signal to the reflectometer module in order to compensate for signal losses in tethers having different lengths. ### Claim 13 (depends on 10) The system of claim 10, wherein the VNA comprises a thermally managed amplifier stage for amplifying the RF signal prior to transmitting the RF signal to the reflectometer module. ### Claim 14 (depends on 10) The system of claim 10, wherein the VNA comprises amplifier stage for amplifying the RF signal in a narrowband frequency range of the reflectometer module prior to transmitting the RF signal to the reflectometer module whereby the amplified RF signal can be transmitted over a longer length of tether while having sufficient power at the reflectometer module to generate test signals for transmission to the DUT. ### Claim 15 (depends on 10) The system of claim 10, wherein the tether is five meters long and the VNA comprises amplifier stage for amplifying the RF signal in a narrowband frequency range of the reflectometer module prior to transmitting the RF signal to the reflectometer module whereby the amplified RF signal can be transmitted over the five meter long tether while having sufficient power at the reflectometer module to generate test signals for transmission to the DUT.