# US 10,871,446 B2 · Measurement device, electronic apparatus and measurement method

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- Number: US 10,871,446 B2
- Document ID: US10871446B2
- Status: Granted
- Kind: B2
- Application number: 16/454,114
- Filed: 2019-06-27
- Published: 2020-01-02
- Granted: 2020-12-22
- Earliest claimed: 2018-06-28
- Assignees: Seiko Epson Corporation
- Applicants: Seiko Epson Corporation
- Inventors: Hideaki Kasahara
- Web page: https://patentgrep.com/patent/US10871446B2

## CPC

- G01N 21/255: {Details, e.g. use of specially adapted sources, lighting or optical systems}
- G01N 21/55: Specular reflectivity
- G01J 3/027: {Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation}
- G01J 3/26: using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
- G01J 3/501: {Colorimeters using spectrally-selective light sources, e.g. LEDs}
- G01J 3/10: Arrangements of light sources specially adapted for spectrometry or colorimetry
- G01J 2003/104: {Monochromatic plural sources}
- G01J 2003/106: {the two sources being alternating or selectable, e.g. in two ranges or line:continuum}
- G01N 21/86: Investigating moving sheets (G01N21/89 takes precedence)
- G01N 2021/555: {Measuring total reflection power, i.e. scattering and specular}
- G01N 2021/6417: {Spectrofluorimetric devices}
- G01N 2201/0627: Use of several LED's for spectral resolution
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)
- G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY (light sources F21, H01J, H01K, H05B; investigating properties of materials by optical means G01N)

## Abstract

A measurement device includes a plurality of light sources configured to emit light toward a measurement object, and having a same emission spectrum, a spectroscopic measurement section configured to perform spectroscopic measurement on the light reflected by the measurement object, a light source switching section configured to switch a combination of the light sources to be put on or off out of the plurality of light sources, and an arithmetic section configured to calculate the spectral reflectivity of the measurement object based on a spectroscopic measurement result obtained by the spectroscopic measurement section when putting on or off the plurality of light sources with a plurality of the combinations.

## Claims

### Claim 1

A measurement device comprising:
a plurality of light sources configured to emit first light toward a measurement object, and having a same emission spectrum;
a spectroscopic filter configured to receive second light reflected by the measurement object irradiated with the first light to output third light with a spectral wavelength;
a light receiving element configured to receive the third light to output a light reception signal;
a light source switching section configured to switch a plurality of combinations of the light sources to be put on or off out of the plurality of light sources; and
an arithmetic section configured to calculate a spectral reflectivity of the measurement object based on the reception signal when switching the plurality of light sources between the plurality of combinations.

### Claim 2 (depends on 1)

The measurement device according to claim 1, wherein
the arithmetic section calculates a partial spectral reflectivity corresponding to each of the plurality of combinations based on the light reception signal corresponding to each combination, and combines a plurality of the partial spectral reflectivities corresponding to the plurality of combinations with each other to calculate the spectral reflectivity.

### Claim 3 (depends on 2)

The measurement device according to claim 2, wherein
the arithmetic section defines an average value of the partial spectral reflectivities xi with respect to a wavelength λi as xavi, and a standard deviation of the partial spectral reflectivities xi with respect to the wavelength λi as σi, and calculates the spectral reflectivities with respect to the wavelength λi as Ai=xavi+kσi, and Ai+n=xavi−kσi.

### Claim 4 (depends on 1)

The measurement device according to claim 1, wherein
the arithmetic section calculates the spectral reflectivity based on the light reception signal obtained when switching the plurality of combinations with respect to a plurality of measurement positions included in the measurement object.

### Claim 5 (depends on 1)

The measurement device according to claim 1, wherein
the plurality of combinations include the combination of putting any one of the light sources on and putting the other of the light sources off.

### Claim 6 (depends on 1)

An electronic apparatus comprising:
the measurement device according to claim 1; and
a type discrimination section configured to discriminate a type of the measurement object based on the spectral reflectivity measured by the measurement device.

### Claim 7

A measurement method of a measurement device including
a plurality of light sources configured to emit first light toward a measurement object, and having a same emission spectrum;
a spectroscopic filter configured to receive second light reflected by the measurement object irradiated with the first light to output third light with a spectral wavelength;
a light receiving element configured to receive the third light to output a light reception signal;
the method comprising:
switching a plurality of combinations of the light sources to be put on or off out of the plurality of light sources; and
calculating a spectral reflectivity of the measurement object based on the reception signal when switching the plurality of light sources between the plurality of the combinations.