# US 10,871,398 B2 · Gas analyzer

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- Number: US 10,871,398 B2
- Document ID: US10871398B2
- Status: Granted
- Kind: B2
- Application number: 16/385,870
- Filed: 2019-04-16
- Published: 2019-10-17
- Granted: 2020-12-22
- Earliest claimed: 2018-04-16
- Assignees: Yokogawa Electric Corporation
- Applicants: Yokogawa Electric Corporation
- Inventors: Yoshitaka Kobayashi; Junichi Matsuo
- Web page: https://patentgrep.com/patent/US10871398B2

## CPC

- G01J 3/42: Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry (beam switching arrangements G01J3/08)
- G01N 21/39: using tunable lasers
- G01J 3/0208: {using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction}
- G01J 3/021: {using plane or convex mirrors, parallel phase plates, or particular reflectors}
- G01N 21/3504: for analysing gases, e.g. multi-gas analysis
- G01N 21/8507: {Probe photometers, i.e. with optical measuring part dipped into fluid sample}
- G01J 2003/421: {Single beam}
- G01J 2003/423: {Spectral arrangements using lasers, e.g. tunable}
- G01N 2021/8521: {with a combination mirror cell-cuvette}
- G01N 2021/8578: {Gaseous flow}
- G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY (light sources F21, H01J, H01K, H05B; investigating properties of materials by optical means G01N)
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)

## Abstract

A gas analyzer includes an optical emitter that irradiates measurement light into a measurement region including a gas to be measured; a reflector that reflects the measurement light irradiated from the optical emitter; an optical receiver that receives the measurement light reflected by the reflector; and an aligner that expands a beam diameter of the measurement light at the reflector.

## Claims

### Claim 1

A gas analyzer comprising:
an optical emitter that irradiates measurement light into a measurement region including a gas to be measured;
a probe that extends along an optical axis of the measurement light so as to overlap the measurement region inside the probe;
a reflector that reflects the measurement light irradiated from the optical emitter and that is positioned at an opposite side of the probe from the optical emitter;
an optical receiver that receives the measurement light reflected by the reflector; and
an aligner that expands a beam diameter of the measurement light at the reflector to a value at which the measurement light includes the reflector, wherein the value is based on a length of the probe and an amount of the measurement light that the optical receiver needs to receive for analysis of the measurement light.

### Claim 2 (depends on 1)

The gas analyzer of claim 1, wherein the aligner expands the beam diameter of the measurement light to be greater than a width of the reflector in a direction substantially orthogonal to an optical axis of the measurement light.

### Claim 3 (depends on 1)

The gas analyzer of claim 1, wherein the aligner comprises an optical lens disposed between the optical emitter and the measurement region and that condenses the measurement light.

### Claim 4 (depends on 3)

The gas analyzer of claim 3,
wherein the optical lens is a plano-convex lens,
wherein a flat surface of the plano-convex lens faces the optical emitter, and
wherein a convex surface of the plano-convex lens faces the measurement region.

### Claim 5 (depends on 3)

The gas analyzer of claim 3, wherein the aligner further comprises an alignment mechanism that changes a distance between the optical lens and the optical emitter along an optical axis of the measurement light.

### Claim 6 (depends on 5)

The gas analyzer of claim 5,
wherein the alignment mechanism comprises an alignment screw rotatably supported about an axis substantially parallel to the optical axis by a fastener that fixes the optical lens, and
wherein one end of the alignment screw is in contact with the optical emitter, and another end of the alignment screw is exposed from the fastener at an opposite side from the optical emitter.