Semiconductor device, electronic control unit and vehicle apparatus

An electronic control unit comprising a wiring substrate on which a semiconductor device formed by one package and a connector coupled to the semiconductor device are mounted,

• wherein the semiconductor device includes:
• a first semiconductor chip and a second semiconductor chip mounted on the one package;
• and
• a load driving terminal,
• the connector includes a load driving connector terminal coupled to the load driving terminal through a wiring on the wiring substrate and supplies power to a load,
• the first semiconductor chip includes:
• a power-supply transistor for supplying power to the load through the load driving terminal and the load driving connector terminal;
• a driver circuit for driving the power-supply transistor;
• a first terminal;
• a current detecting resistor coupled to the first terminal so as to output a voltage in accordance with a flowing current to the first terminal;
• an abnormality detection circuit for detecting an abnormality;
• and
• a current generation circuit for generating a sense current on which a current flowing through the load driving terminal is reflected and a fault current indicating that the abnormality detection circuit has detected the abnormality so that the current generation circuit selects either the sense current or the fault current from the current generation circuit to flow through the current detecting resistor in accordance with presence or absence of detection of the abnormality, and
• the second semiconductor chip includes:
• a second terminal to be coupled to the first terminal;
• a first analog-digital conversion circuit for converting an analog signal to be input to the second terminal into a first digital signal;
• a storage circuit for storing a current value of the fault current obtained in an inspection process of the semiconductor device as a determination reference value;
• and
• an arithmetic processing circuit that sets a standard range based on the determination reference value, and determines the presence or absence of the detection of the abnormality in the abnormality detection circuit based on whether or not a current value indicated by the first digital signal is included within the standard range,
• wherein the current generation circuit includes a variable current source and a constant current source, the variable current source allows the current to flow to the current detecting resistor through the first terminal, and the constant current supply allows a current to flow to the current detecting resistor through the first terminal.

A semiconductor device comprising:

• a power-supply transistor configured for supplying power to a load through a load driving terminal and a load driving connector terminal;
• a driver circuit configured for driving the power-supply transistor;
• a first terminal;
• a current detecting resistor coupled to the first terminal so as to output a voltage in accordance with a flowing current to the first terminal;
• an abnormality detection circuit configured for detecting an abnormality;
• a current generation circuit configured for generating a sense current on which a current flowing through the load driving terminal is reflected and a fault current indicating that the abnormality detection circuit has detected the abnormality so that the current generation circuit selects either the sense current or the fault current from the current generation circuit to flow through the current detecting resistor in accordance with presence or absence of detection of the abnormality;
• a second terminal to be coupled to the first terminal;
• a first analog-digital conversion circuit configured for converting an analog signal to be input to the second terminal into a first digital signal;
• a storage circuit configured for storing a current value of the fault current obtained in an inspection process of the semiconductor device as a determination reference value;
• and
• an arithmetic processing circuit configured to set a standard range based on the determination reference value, and determines the presence or absence of the detection of the abnormality in the abnormality detection circuit based on whether or not a current value indicated by the first digital signal is included within the standard range,
• wherein the current generation circuit includes a variable current source and a constant current source, the variable current source allows the current to flow to the current detecting resistor through the first terminal, and the constant current supply allows a current to flow to the current detecting resistor through the first terminal.

A semiconductor device comprising:

• a first semiconductor chip;
• and
• a second semiconductor chip separately mounted on one package with the first semiconductor chip,
• wherein the first semiconductor chip includes:
• a current detecting resistor configured to output a voltage in accordance with a flowing current to a first terminal;
• an abnormality detection circuit configured for detecting an abnormality;
• and
• a current generation circuit configured for generating a sense current on which a current flowing through the load driving terminal is reflected and a fault current indicating that the abnormality detection circuit has detected the abnormality so that the current generation circuit allows from a selection of either the sense current or the fault current from the current generation circuit to flow through the current detecting resistor in accordance with presence or absence of detection of the abnormality, and
• the second semiconductor chip includes:
• a first analog-digital conversion circuit for converting an analog signal to be input to a second terminal into a first digital signal, the second terminal connected to the first terminal;
• a storage circuit for storing a current value of the fault current obtained in an inspection process of the semiconductor device as a determination reference value;
• and
• an arithmetic processing circuit that sets a standard range based on the determination reference value, and determines the presence or absence of the detection of the abnormality in the abnormality detection circuit based on whether or not a current value indicated by the first digital signal is included within the standard range,
• wherein the current generation circuit includes a variable current source and a constant current source, the variable current source allows the current to flow to the current detecting resistor through the first terminal, and the constant current supply allows a current to flow to the current detecting resistor through the first terminal.