Substrate package having variable marking
AssigneePalo Alto Research Center Incorporated
InventorsJanos Veres, Antonio St. Clair Lloyd Williams, Marc E. Mosko
Life of this patent
Estimating the term…
Abstract
Disclosed are a substrate package, a method of fabricating the substrate package, and a system including the substrate package. The substrate package includes a stack of substrate sheets in an individual form, a continuous form, or a roll form. The stack has a sidewall defined by edges of the substrate sheets and a mark on the sidewall includes mark segments on respective edges. The mark segments vary such that one or more of the mark segments have a respective segment characteristic, such as a length. The segment characteristic can encode information about an attribute of the substrate sheet, such as a physical characteristic of the sheet.
Claims20
A substrate package, comprising:
- one or more substrate sheets arranged in a stack, wherein the stack has a sidewall defined by edges of the one or more substrate sheets;
- and
- a mark on the sidewall, wherein the mark includes a plurality of mark segments on the edges and along a mark axis, wherein the mark varies along the mark axis, and wherein segment characteristics of the plurality of mark segments vary along the mark axis such that a mark segment on an edge of a substrate sheet has a segment characteristic specific to an attribute of the substrate sheet, and wherein the marking is a variable marking comprising information associated with the one or more substrate sheets applied to the sidewall.
A method, comprising:
- arranging one or more substrate sheets into a stack having edges of the one or more substrate sheets forming a sidewall defined by the edges;
- and
- applying a mark on the sidewall, wherein the mark includes a plurality of mark segments on the edges and along a mark axis, wherein the mark varies along the mark axis, and wherein segment characteristics of the plurality of mark segments vary along the mark axis such that a mark segment on an edge of a substrate sheet has a segment characteristic specific to an attribute of the substrate sheet, and wherein the marking is a variable marking comprising information associated with the one or more substrate sheets applied to the sidewall.
A system, comprising:
- a substrate package comprising a stack of one or more substrate sheets having respective edges, wherein the stack has a sidewall defined by the edges, and a mark on the sidewall, wherein the mark includes a plurality of mark segments on the edges and along a mark axis, wherein the mark varies along the mark axis, and wherein segment characteristics of the plurality of mark segments vary along the mark axis such that a mark segment on an edge of a substrate sheet has a segment characteristic specific to an attribute of the substrate sheet, and wherein the mark is a variable marking comprising information associated with the one or more substrate sheets applied to the sidewall;
- and
- a printer comprising:
- an optical reader to detect the segment characteristic, and
- one or more processors configured to determine, based on the segment characteristic, the attribute of the substrate sheet.
Dependencies are inferred from the claim text.