US 10,855,301 B2Granted

Digital to analog converter device and calibration method

AssigneeRealtek Semiconductor Corp.

InventorXiao-Bo Zhou

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Abstract

A digital-to-analog converter (DAC) device includes a DAC circuitry and a calibration circuitry. The DAC circuitry includes first and second DAC circuits which generate first and second signals according to an input pattern. The input pattern includes at least one of first logic value and at least one of second logic value that have different numbers. The calibration circuitry performs a calibration operation according to first and second comparison results, to generate a control signal for controlling the second DAC circuit. The first comparison results are comparison results of the first and the second signals when the input pattern is a first pattern, the second comparison results are comparison results of the first and the second signals when the input pattern is a second pattern, and the first pattern is inverse to the second pattern.

Claims20

Dependent claims

A digital-to-analog converter (DAC) device, comprising:

a DAC circuitry comprising:
a first DAC circuit;
and
a second DAC circuit,
wherein the first DAC circuit and the second DAC circuit are configured to generate a first signal and a second signal according to an input pattern, the input pattern comprises at least one first logic value and at least one second logic value, and a number of the at least one first logic value is different from a number of the at least one second logic value;
and
a calibration circuitry configured to perform a calibration operation according to a plurality of first comparison results and a plurality of second comparison results, in order to generate a control signal for controlling the second DAC circuit,
wherein the plurality of first comparison results are results of comparing the first signal with the second signal when the input pattern is a first pattern, the plurality of second comparison results are results of comparing the first signal with the second signal when the input pattern is a second pattern, and the first pattern is inverse to the second pattern.

5 more elements

A calibration method, comprising:

generating, by a first digital-to-analog converter (DAC) circuit and a second DAC circuit, a first signal and a second signal according to an input pattern, wherein the input pattern comprises at least one first logic value and at least one second logic value, and a number of the at least one first logic value is different from a number of the at least one second logic value;
and
performing a calibration operation according to a plurality of first comparison results and a plurality of second comparison results, in order to generate a control signal for controlling the second DAC circuit,
wherein the plurality of first comparison results are results of comparing the first signal with the second signal when the input pattern is a first pattern, the plurality of second comparison results are results of comparing the first signal with the second signal when the input pattern is a second pattern, and the first pattern is inverse to the second pattern.

1 more element

Dependencies are inferred from the claim text.

Facts

Application: 16/785,763Filed 10 Feb 2020
Priority: CN 2019 1 014677127 Feb 2019
Published: US 2020/0274544 A127 Aug 2020
Granted: 1 Dec 2020
Term ends: Not estimatedThe source records don’t support an estimate.

Classification5 codes

H03M 1/1023
At one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error: offset correction
H03M 1/1009
Calibration or testing: calibration
H03M 1/1014
Calibration: at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
H03M 1/66
Analogue/digital conversion; Digital/analogue conversion: digital/analogue converters