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US 10,855,046 B2Granted
Nonlinear optical imaging
AssigneeMassachusetts Institute of Technology
InventorsWilliam A. Tisdale, Yunan Gao, Aaron Jacob Goodman
Life of this patent
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Abstract
Phase modulated Optical Parametric Amplification Imaging (p-OPA), can be used to determine the magnitude and the sign of the second-order nonlinear susceptibility of a material, and its spatial variation.
Claims18
A system for detecting optical parametric amplification comprising
- a source of a first laser beam having a first frequency and a second laser beam having a second frequency, wherein the first frequency is two times the second frequency and at least one of the first laser beam and the second laser beam have a modulated phase;
- a modulation unit of source that controls the modulated phase of the first laser beam and second laser beam such that if a sample is active for optical parametric amplification, phase modulation leads to intensity exchange between the two laser pulses,
- a sample holder configured to hold a sample that contacts the first laser beam and the second laser beam;
- a lock-in amplifier;
- a detector configured to detect the first laser beam, the second laser beam, or both after contacting the sample, wherein the lock-in amplifier and detector extract intensity of the detected beam using the modulated phase.
2 more elements
A method of optical parametric amplification comprising
- supplying a first laser beam having a first frequency and a second laser beam having a second frequency, wherein the first frequency is two times the second frequency and at least one of the first laser beam and the second laser beam have a modulated phase;
- exposing a sample to the first laser beam, the second laser beam, or both;
- detecting intensity of the first laser beam, the second laser beam, or both after contacting the sample using the modulated phase.
Dependencies are inferred from the claim text.