Method of defect detection on a specimen and system thereof
AssigneeApplied Material Israel, Ltd.
InventorsElad Cohen, Denis Simakov
Life of this patent
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AssigneeApplied Material Israel, Ltd.
InventorsElad Cohen, Denis Simakov
Estimating the term…
There are provided a system and method of defect detection on a specimen, the method comprising: performing partitioning for each of one or more portions of a first die; receiving one or more noise maps indicative of noise distribution on second images captured for one or more portions of a second die; performing segmentation for each noise map in runtime, the segmentation for a given noise map including: calculating a score for each region, the given noise map aligned with the regions and each region is associated with noise data aligned therein, the score for a given region calculated at least based on the noise data associated therewith; and associating each region with one segmentation label of a predefined set of segmentation labels indicative of noise levels based on the score, thereby obtaining a set of segments each corresponding to one or more regions associated with the same segmentation label.
A computerized system of defect detection on a specimen, the system comprising:
A computerized method of defect detection on a specimen, the method performed by a processing unit operatively connected to an examination tool, the processing unit comprising a memory and a processor operatively coupled thereto, the method comprising:
A non-transitory computer readable storage medium tangibly embodying a program of instructions that, when executed by a computer, cause the computer to perform a method of defect detection on a specimen, the method comprising:
Dependencies are inferred from the claim text.