Collation/retrieval system, collation/retrieval server, image feature extraction apparatus, collation/retrieval method, and program

A collation method performed by a processor executing instructions stored on a memory coupled to the processor, the collation method comprising:

• obtaining a second surface image of a metal workpiece or a semiconductor chip;
• collating a second image feature with first image features, wherein
• the first image features are stored in a storage device,
• the second image feature is extracted from the second surface image, and
• the storage device stores the first image features and management information in a mutually associated manner, wherein
• the first surface features are extracted from first surface images of metal workpieces or semiconductor chips, and
• the management information correspond to the metal workpieces or the semiconductor chips;
• and
• in response to matching the second image feature with one of the first image features, outputting the management information associated with the one of the first image features, wherein the management information includes at least one of a production site, a producer name, a lot number, a production date, a quality information, a shipping point, and a ship date of the metal workpiece or the semiconductor chip corresponding to the second surface image.

A collation system comprising:

• a storage device configured to store first image features and management information in a mutually associated manner, wherein
• the first image features are extracted from first surface images of metal workpieces or semiconductor chips, and
• the management information correspond to the metal workpieces or semiconductor chips;
• at least one memory configured to store instructions;
• and
• at least one processor coupled to the at least one memory and configured to execute the instructions to:
• obtain a second surface image of a metal workpiece or a semiconductor chip,
• collate a second image feature with the first image features, wherein the second image feature is extracted from the second surface image, and
• in response to matching the second image feature with one of the first image features, output the management information associated with the one of the first image features, wherein the management information includes at least one of a production site, a producer name, a lot number, a production date, a quality information, a shipping point, and a ship date of the metal workpiece or the semiconductor chip corresponding to the second surface image.