Integrated circuits for generating input/output latency performance metrics using real-time clock (RTC) read measurement module
AssigneeIntel Corporation
InventorsGarrett Matthias Drown, Patrick Lu
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AssigneeIntel Corporation
InventorsGarrett Matthias Drown, Patrick Lu
Estimating the term…
An integrated circuit includes technology for generating input/output (I/O) latency metrics. The integrated circuit includes a real-time clock (RTC), a read measurement register, and a read latency measurement module. The read latency measurement module includes control logic to perform operations comprising (a) in response to receipt of read responses that complete read requests associated with an I/O device, automatically calculating read latencies for the completed read requests, based at least in part on time measurements from the RTC for initiation and completion of the read requests; (b) automatically calculating an average read latency for the completed read requests, based at least in part on the calculated read latencies for the completed read requests; and (c) automatically updating the read measurement register to record the average read latency for the completed read requests. Other embodiments are described and claimed.
An integrated circuit with technology for generating input/output latency metrics, the integrated circuit comprising:
A data processing system with technology for generating input/output latency metrics, the data processing system comprising:
A method for generating input/output latency metrics, the method comprising:
An integrated circuit with technology for generating input/output latency metrics, the integrated circuit comprising:
Dependencies are inferred from the claim text.