Dynamic temperature compensation in a memory component
AssigneeMicron Technology, Inc.
InventorsLarry J. Koudele, Bruce A. Liikanen, Steve Kientz
Life of this patent
Estimating the term…
Abstract
A dynamic temperature compensation trim for use in temperature compensating a memory operation on a memory call of a memory component. The dynamic temperature compensation trim is based on a temperature of the memory component and based on in-service data for the memory operation on the memory cell. A register for the memory operation is modified based on the dynamic temperature compensation trim.
Claims20
A system, comprising:
- a memory component having a register corresponding to a memory operation on a memory cell of the memory component;
- and
- a processing device, operatively coupled with the memory component, to:
- determine a dynamic temperature compensation trim for use in temperature compensating the memory operation, the determining of the dynamic temperature compensation trim being based on a temperature of the memory component and based on in-service data for the memory operation on the memory cell, and
- modify the register based on the dynamic temperature compensation trim,
- wherein the in-service data includes at least one of read level calibration data or program verify level calibration data, where the program verify level calibration data checks a write operation voltage level.
A method, comprising:
- determining a dynamic temperature compensation trim for use in temperature compensating a memory operation on a memory cell of a memory component, the determining of the dynamic temperature compensation trim based on a temperature of the memory component and based on in-service data for the memory operation on the memory cell;
- and
- modifying a register corresponding to the memory operation on the memory cell based on the dynamic temperature compensation trim,
- wherein the in-service data includes at least one of read level calibration data or program verify level calibration data, where the program verify level calibration data checks a write operation voltage level.
A non-transitory computer-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to:
- determine a dynamic temperature compensation trim for use in temperature compensating a memory operation on a memory cell of a memory component, the determining of the dynamic temperature compensation trim based on a temperature of the memory component and based on in-service data for the memory operation on the memory cell;
- and
- modify a register corresponding to the memory operation on the memory cell based on the dynamic temperature compensation trim,
- wherein the in-service data includes at least one of read level calibration data or program verify level calibration data, where the program verify level calibration data checks a write operation voltage level.
Dependencies are inferred from the claim text.