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US 10,852,397 B2Granted
LIDAR device and method for scanning a scan angle
AssigneeRobert Bosch GmbH
InventorsHans-Jochen Schwarz, Stefan Spiessberger
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Abstract
A method for scanning a scan angle in which at least two beams are generated. The at least two beams are deflected along the scan angle, and the at least two incident beams reflected on an object are received and detected, the at least two beams being generated and detected in an offset manner with respect to one another. Furthermore, a LIDAR device for scanning a scan angle is also described.
Claims11
A method for scanning a scan angle, the method comprising:
- generating, via a first beam source and a second beam source, at least two beams, wherein each of the beam sources each have one emission surface;
- deflecting the at least two beams along the scan angle, so that there is a gapless illumination of the scan angle;
- receiving at least two incident beams reflected on an object;
- and
- detecting, via at least one detector, the at least two incident beams;
- wherein the at least two beams are generated in an offset manner with respect to one another, and the at least two incident beams are detected in an offset manner with respect to one another,
- wherein the at least one detector includes multiple detector cells,
- wherein the beam sources are combined to form a stack, and
- wherein the emission surfaces are arranged in the offset manner with respect to each other and form an overlap area.
6 more elements
A LIDAR device for scanning a scan angle, comprising:
- at least two beam sources for generating at least two beams, wherein each of the beam sources each have one emission surface;
- a deflection unit for deflecting the at least two beams along the scan angle, so that there is a gapless illumination of the scan angle;
- and
- a receiving unit for receiving and guiding at least two incident beams reflected on an object onto at least one detector;
- wherein the at least two beam sources are situated so as to be offset with respect to one another and at least one first beam source of the at least two beam sources closes at least one scanning gap of at least one second beam source of the at least two beam sources,
- wherein the at least one detector includes multiple detector cells,
- wherein the beam sources are combined to form a stack, and
- wherein the emission surfaces are arranged in the offset manner with respect to each other and form an overlap area.
5 more elements
Dependencies are inferred from the claim text.