Scan test control decoder with storage elements for use within integrated circuit (IC) devices having limited test interface
AssigneeTexas Instruments Incorporated
InventorsMudasir Shafat Kawoosa, Vishal Diwan
Life of this patent
Estimating the term…
Abstract
An integrated circuit (IC) includes logic components and a scan test circuit coupled to the logic components. The IC also includes a scan input pin coupled to the scan test circuit. The IC also includes a scan input/output pin coupled to the scan test circuit. The scan test circuit includes a decoder coupled to at least one of the scan input pin and the scan input/output pin. The decoder includes storage elements configured to store different scan control signals and to output at least one of the different scan control signals in response to a master control signal.
Claims22
An integrated circuit (IC), comprising:
- logic components;
- a scan test circuit coupled to the logic components;
- a scan input pin coupled to the scan test circuit;
- a scan input/output pin coupled to the scan test circuit, wherein the scan test circuit comprises a decoder coupled to at least one of the scan input pin and the scan input/output pin, wherein the decoder comprises storage elements configured to store different scan control signals and to output at least one of the different scan control signals in response to a master control signal.
An electronic circuit, comprising:
- logic components;
- a scan path coupled to the logic components;
- scan data pins and scan control pins coupled to the scan path;
- a decoder coupled to the scan data pins and the scan control pins, wherein the decoder comprises storage elements configured to store different scan control signals and to output at least one of the different scan control signals in response to a master control signal;
- and
- tester interface nodes coupled to the decoder.
A method for performing an integrated circuit scan test, comprising:
- selectively storing, by a decoder, different scan control signals,
- receiving, by the decoder, a master control signal;
- outputting, by the decoder, at least one of the different scan control signals in response to receiving the master control signal;
- and
- using the at least one output scan control signal to perform scan test operations.
Dependencies are inferred from the claim text.