US 10,852,351 B1 · Iterative approach to determine failure threshold associated with desired circuit yield in integrated circuits

Abstract

Systems and methods of developing an integrated circuit implement selecting a desired yield for a circuit used in the integrated circuit. The desired yield corresponds to a desired failure probability of the circuit. The method includes determining a parameter threshold value that corresponds with the desired yield. The circuit passes if a parameter associated with the circuit is below the parameter threshold value and the desired yield indicates a percentage of instances of the circuit that pass according to the parameter threshold value. The method also includes using the parameter threshold value that corresponds with the desired yield during testing and improvement of a design of the integrated circuit, and providing the design of the integrated circuit for fabrication.

Claims20

Dependent claims

A method of developing an integrated circuit, the method comprising:

selecting a desired yield for a circuit used in the integrated circuit, wherein the desired yield corresponds to a desired failure probability of the circuit;
determining, using a processor, a parameter threshold value that corresponds with the desired yield, wherein the parameter is a circuit simulation output used in testing and improvement of a design of the integrated circuit and the circuit passes if the parameter associated with the circuit is below the parameter threshold value and the desired yield indicates a percentage of instances of the circuit that pass according to the parameter threshold value;
using, by the processor, the parameter threshold value that corresponds with the desired yield during the testing and improvement of the design of the integrated circuit;
and
providing the design of the integrated circuit for fabrication.

2 more elements

A system, comprising:

a memory device configured to store a design of the integrated circuit;
and
a processor configured to obtain a desired yield for a circuit used in the integrated circuit, wherein the desired yield corresponds to a desired failure probability of the circuit, to determine a parameter threshold value that corresponds with the desired yield, wherein the parameter is a circuit simulation output used in testing and improvement of a design of the integrated circuit and the circuit passes if the parameter associated with the circuit is below the parameter threshold value and the desired yield indicates a percentage of instances of the circuit that pass according to the parameter threshold value, to use the parameter threshold value that corresponds with the desired yield during testing and improvement of the design of the integrated circuit, and to provide the design of the integrated circuit for fabrication.

A computer program product for developing an integrated circuit, the computer program product comprising a computer readable storage medium having program instructions embodied therewith, the program instructions executable by a processor to perform a method comprising:

selecting a desired yield for a circuit used in the integrated circuit, wherein the desired yield corresponds to a desired failure probability of the circuit;
determining a parameter threshold value that corresponds with the desired yield, wherein the parameter is a circuit simulation output used in testing and improvement of a design of the integrated circuit and the circuit passes if the parameter associated with the circuit is below the parameter threshold value and the desired yield indicates a percentage of instances of the circuit that pass according to the parameter threshold value;
and
using the parameter threshold value that corresponds with the desired yield during testing and improvement of the design of the integrated circuit, wherein the design of the integrated circuit is provided for fabrication.

1 more element

Dependencies are inferred from the claim text.

Iterative approach to determine failure threshold associated with desired circuit yield in integrated circuits

Life of this patent

Iterative approach to determine failure threshold associated with desired circuit yield in integrated circuits

Life of this patent

Abstract

Claims20