Circuit board testing device and method thereof

A circuit board testing device electrically coupled to a measurement gauge and adapted for testing a circuit board, the circuit board testing device comprising a processor and a memory, the memory storing a record of test data of the circuit board testing device testing the circuit board, the processor configured to:

• configure, before testing the circuit board, measurement parameters of the measurement gauge;
• configure measurement rules for testing the circuit board;
• confirm a circuit of the circuit board to be tested according to the record of test data;
• control the measurement gauge to test the circuit of the circuit board to be tested when the measurement gauge is electrically coupled to the circuit of the circuit board to be tested;
• receive measurement data from the measurement gauge;
• and
• analyze a faulty region of the circuit board according to the record of test data and the measurement data;
• wherein the record of test data comprises at least a plurality of circuits of the circuit board tested during each time of testing the circuit board and a corresponding voltage value of each circuit of the circuit board;
• the circuit of the circuit board to be tested is confirmed as the circuit having a most number of times of being tested in the record of test data;
• the record of test data is updated after each time of testing the circuit to be tested;
• after each circuit is tested, a circuit having a most number of times of being tested is confirmed as the circuit to be tested next until the faulty region of the circuit board is determined or until there are no more circuits to be tested.