Test handler head having reverse funnel design

A test head for a semiconductor device handler, the test head comprising:

• a plunger;
• a funnel insert movably attached to the plunger via a funnel insert spring, the funnel insert having a channel extending axially therethrough, and the funnel insert including a plurality of sloped inner walls that are sloped outwardly in a distal direction of the funnel insert and configured to contact upper edges of a semiconductor device to center the semiconductor device in the funnel insert;
• a nest body having an inner flange at a distal end thereof;
• a spring retainer plate attached to the nest body;
• and
• a plunger spring,
• wherein the plunger includes
• a projecting portion that extends through the channel of the funnel insert,
• a plate portion, and
• an elongated portion extending proximally from the plate portion and extending through an opening in the spring retainer plate, and
• wherein, when the funnel insert spring is in an uncompressed state, a distal end of the funnel insert extends past a distal end of the projecting portion of the plunger,
• wherein the plunger spring is disposed between a lower surface of the spring retainer plate and an upper surface of the plate portion of the plunger, such that the plunger spring presses the plunger against an upper surface of the inner flange of the nest body, and
• wherein a spring constant of the funnel insert spring is lower than a spring constant of the plunger spring.