Filter array reconstructive spectrometry
AssigneeThe Regents of the University of California
InventorsZhaowei Liu, Qian Ma, Eric Huang
Life of this patent
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AssigneeThe Regents of the University of California
InventorsZhaowei Liu, Qian Ma, Eric Huang
Estimating the term…
A spectrometry system may include an etalon array having a first etalon and a second etalon. The first etalon may be configured to process light to at least generate a first transmission pattern. The first transmission pattern may have at least a first transmission peak corresponding to a first wavelength in an original spectrum of the light. The second etalon may be configured to process the light to at least generate a second transmission pattern. The second transmission pattern may have at least a second transmission peak corresponding to a second wavelength in the original spectrum of the light. The first etalon may have a different thickness than the second etalon in order for the first transmission pattern to have at least one transmission peak that is at a different wavelength than the second transmission pattern. The first transmission pattern and the second transmission pattern may enable a reconstruction the original spectrum of the light.
A system, comprising:
A method, comprising:
Dependencies are inferred from the claim text.