Signal measuring device
AssigneeMitsubishi Electric Corporation
InventorYoichiro Hamaya
Life of this patent
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AssigneeMitsubishi Electric Corporation
InventorYoichiro Hamaya
Estimating the term…
This signal measuring device includes: one input circuit for receiving a process signal from each of first through Mth detection units; a signal switching unit for performing open/close switching between each detection unit and the input circuit; a signal processing unit connected to the input circuit and for processing the process signal; and a switching command unit for outputting, to the signal switching unit, a switching command signal that corresponds to an open/close time set such that one of the plurality of the detection units is connected to the input circuit, the switching command unit outputting, to the signal processing unit, a measurement command signal that corresponds to a stable measurement time which is set for each of the plurality of the detection units and after which the process signal inputted from each of the plurality of the detection units to the input circuit is stably measurable.
A signal measuring device measuring process signals in a signal measurement target section, the signal measurement target section including a plurality of detection units, each detection unit detecting a continuously varying process signal, the signal measuring device comprising:
A signal measuring device measuring process signals in a signal measurement target section, the signal measurement target section including a plurality of detection units, each detection unit detecting a continuously varying process signal, the signal measuring device comprising:
Dependencies are inferred from the claim text.