Information measuring device

An information measuring device mounted on an apparatus, the apparatus steadily repeating a predetermined operation, the information measuring device comprising:

• a sensor that is configured to sense a phenomenon, the phenomenon periodically occurring on the apparatus while being synchronized with the steady repetition of the predetermined operation;
• and
• a control device that controls the predetermined operation of the apparatus and obtains information via the sensor, wherein:
• the control device obtains the information via the sensor at a sampling cycle, and the control device associates the information with an operation phase in the predetermined operation so as to generate change in the phenomenon in one cycle based on the information obtained during the predetermined operation performed several times,
• meanwhile, an operation cycle where the predetermined operation is repeated in the apparatus, the sampling cycle, and a duration where the predetermined operation is steadily repeated in the apparatus are included in measurement parameters,
• the control device calculates at least one of:
• an optimum sampling cycle according to formula:
• optimum sampling cycle (STO)=(n−1/DN)×LT (n=1, 2, 3, . . . ), and
• an optimum operation cycle according to formula:
• optimum operation cycle (LTO)=ST/(n−1/DN) (n=1, 2, 3, . . . ),
• where STO=optimum sampling cycle, DN=number of operation phases within the operation cycle at which measurements are taken, LT=current operation cycle and ST=current sampling cycle, and
• the control device causes at least one of the following to occur:
• the operation cycle is changed to LTO, and
• the sampling cycle is changed to STO.