Temperature determination using radiation diffraction
AssigneeROLLS-ROYCE plc
InventorMichael George Glavicic
Life of this patent
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Abstract
A system includes a focusing system, a radiation detector, and a controller. The focusing system is configured to receive an incident radiation beam from a radiation source and focus the incident radiation beam on a portion of a component of a high temperature mechanical system. The incident radiation beam scatters from the portion of the component as a diffracted radiation beam. The focusing system is further configured to focus the diffracted radiation beam from the portion of the component on the radiation detector. The radiation detector is configured to detect a diffraction pattern of the diffracted radiation beam from the portion of the component. The controller is configured to determine a temperature of the portion of the component based on the diffraction pattern.
Claims18
A method, comprising:
- receiving, by a focusing system, an incident radiation beam from a radiation source, the radiation source including at least one of an x-ray source or a neutron source, wherein the incident radiation beam comprises an x-ray beam or a neutron beam;
- focusing, using the focusing system, the incident radiation beam on a portion of a component of a high temperature mechanical system, wherein the incident radiation beam scatters as a diffracted radiation beam from the portion of the component;
- focusing, using the focusing system, the diffracted radiation beam from the portion of the component on a radiation detector;
- detecting, by the radiation detector, a diffraction pattern of the diffracted radiation beam from the portion of the component;
- and
- determining a diffraction peak of the diffraction pattern;
- determining a diffraction contribution of mechanical stresses on the portion of the component;
- and
- determining a temperature of the portion of the component based on the diffraction peak and the diffraction contribution of the mechanical stresses.
A system, comprising:
- a focusing system configured to:
- receive an incident radiation beam from a radiation source, the radiation source including at least one of an x-ray source or a neutron source, wherein the incident radiation beam comprises an x-ray beam or a neutron beam;
- focus the incident radiation beam on a portion of a component of a high temperature mechanical system, wherein the incident radiation beam scatters from the portion of the component as a diffracted radiation beam;
- and
- focus the diffracted radiation beam from the portion of the component on a radiation detector;
- the radiation detector configured to detect a diffraction pattern of the diffracted radiation beam from the portion of the component;
- and
- a controller configured to:
- determine a diffraction peak of the diffraction pattern;
- determine a diffraction contribution of mechanical stresses on the portion of the component;
- and
- determine a temperature of the portion of the component based on the diffraction peak and the diffraction contribution of the mechanical stresses.
Dependencies are inferred from the claim text.