Ion detector
AssigneeHamamatsu Photonics K.K.
InventorsHiroshi Kobayashi, Takeshi Endo, Hiroki Moriya, Toshinari Mochizuki
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AssigneeHamamatsu Photonics K.K.
InventorsHiroshi Kobayashi, Takeshi Endo, Hiroki Moriya, Toshinari Mochizuki
Estimating the term…
The present embodiment relates to an ion detector provided with a structure for suppressing degradation over time in an electron multiplication mechanism in the ion detector. The ion detector includes a dynode unit, serving as an electron multiplication mechanism, which multiplies secondary electrons which are emitted in response to incidence of ions, and a semiconductor detector having an electron multiplication function. Further, a focus electrode having an opening that allows passage of secondary electrons is disposed on a trajectory of secondary electrons which are directed from the dynode unit toward the semiconductor detector, and the focus electrode functions to guide secondary electrons from the dynode unit onto an electron incidence surface of the semiconductor detector.
An ion detector comprising:
Dependencies are inferred from the claim text.