Closed-loop testing of integrated circuit card payment terminals
AssigneeWorldpay, LLC
InventorsPatricia Lynn Walters, Steven Scott Cole
Life of this patent
Estimating the term…
Abstract
Technologies for closed-looped testing of integrated circuit card payment terminals include loading a test profile onto an integrated circuit payment card. Authorization request and response messages are locally generated and translated to simulate acquirer processor processing and payment network processing. An outcome report indicative of the outcome of the test transaction is generated and transmitted to a remote certification server. Other embodiments are described and claimed.
Claims20
A method for closed-looped testing of integrated circuit device terminals in a first network environment, the method comprising:
- loading, by a data transfer simulation server of the first network environment, a test data transfer profile onto an integrated circuit device;
- receiving, by the data transfer simulation server and from a merchant transaction server of the first network environment, a test authorization request message for a test data transaction, wherein the test authorization request message is generated by the merchant transaction server and corresponds to the test data transfer profile;
- generating, by the data transfer simulation server remote from the integrated circuit device, a test authorization response message for the test data transaction based on the test data transfer profile;
- transmitting, by the data transfer simulation server, the test authorization response message to the merchant transaction server of the first network environment;
- receiving, by the data transfer simulation server and from the integrated circuit device, test log data, wherein the test log data corresponds to the test data transaction;
- and
- determining, by the data transfer simulation server, whether one or more integrated circuit device terminals in the first network environment may operate outside of the first network environment based on an analysis of the test log data.
One or more machine-readable storage media comprising a plurality of instructions stored thereon that in response to being executed by one or more processors, cause the one or more processors to perform operations for testing integrated circuit device terminals in a first network environment, the operations comprising:
- loading, by a data transfer simulation server in the first network environment, a test data transfer profile onto an integrated circuit device;
- receiving, by the data transfer simulation server and from a merchant transaction server of the first network environment, a test authorization request message for the test data transaction, wherein the test authorization request message is generated by the merchant transaction server and corresponds to the test data transfer profile;
- generating, by the data transfer simulation server remote from the integrated circuit device, a test authorization response message for the test data transaction based on the test data transfer profile;
- transmitting, by the data transfer simulation server, the test authorization response message to the merchant transaction server of the first network environment;
- receiving, by the data transfer simulation server and from the integrated circuit device, test log data, wherein the test log data corresponds to the test data transaction;
- and
- determining, by the data transfer simulation server, whether one or more integrated circuit device terminals in the first network environment may operate outside of the first network environment based on an analysis of the test log data.
A system comprising:
- at least one processor;
- at least one storage storing instructions which, when executed by the at least one processor, cause the at least one processor to perform operations for testing integrated circuit device terminals in a first network environment, the operations comprising:
- loading, by a data transfer simulation server in the first network environment, a test data transfer profile onto an integrated circuit device;
- receiving, by the data transfer simulation server and from a merchant transaction server of the first network environment, a test authorization request message for a test data transaction, wherein the test authorization request message is generated by the merchant transaction server and corresponds to the test data transfer profile;
- generating, by the data transfer simulation server remote from the integrated circuit device, a test authorization response message for the test data transaction based on the test data transfer profile;
- transmitting, by the data transfer simulation server, the test authorization response message to the merchant transaction server of the first network environment;
- receiving, by the data transfer simulation server and from the integrated circuit device, test log data, wherein the test log data corresponds to the test data transaction;
- and
- determining, by the data transfer simulation server, whether one or more integrated circuit device terminals in the first network environment may operate outside of the first network environment based on an analysis of the test log data.
Dependencies are inferred from the claim text.