Inclination measuring device

An inclination measuring device comprising:

• a plurality of light sources;
• an optical system disposed with respect to an irradiated light ray from the plurality of light sources, and configured to irradiate a measurement object with the irradiated light ray and receive a reflected light ray from a measurement surface of the measurement object;
• a light receiving unit comprising at least one spectroscope configured to separate the reflected light ray received by the optical system into wavelength components, and a detector comprising a plurality of light receiving elements corresponding to directions of light rays separated by the spectroscope;
• a light guide comprising a plurality of cores in one cable and configured to optically connect the optical system and the light receiving unit;
• and
• a processor configured to calculate an inclination angle of the measurement surface against an optical axis of the irradiated light ray based on reflected light rays from a plurality of positions on the measurement surface with respect to a plurality of irradiated light rays with which the plurality of positions are irradiated, and based on relative positions of the plurality of cores, wherein
• the plurality of cores are respectively optically connected to the plurality of light sources, and
• the processor causes the plurality of light sources to emit rays sequentially one by one to irradiate the plurality of positions on the measurement surface with the irradiated light rays via the plurality of cores corresponding to the respective plurality of light sources.