US 10,794,963 B2Granted

Line fault signature analysis

AssigneeTexas Instruments Incorporated

InventorsPrasanna U. Rajagopal, Kallikuppa M Sreenivasa, Amit G Kumbasi

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Abstract

In described examples, a time-domain analyzer is arranged to generate an indication of a number of high-frequency events of an electrical monitor signal that includes a fundamental periodic frequency. The high-frequency events include frequencies higher than the fundamental periodic frequency. A frequency-domain analyzer is arranged to generate frequency band information in response to frequencies of the electrical monitor signal that are higher than the fundamental periodic frequency. A fault detector is arranged to monitor the indication of the number of high-frequency events and the generated frequency band information, and to generate a fault flag in response to the monitored indication of the number of high-frequency events and the generated frequency band information.

Claims20

Dependent claims

A system comprising:

a sensor configured to couple to a line, wherein the sensor includes a set of outputs to provide a sensor signal in response to power through the line;
a low-pass filter that includes:
an input coupled to the set of outputs of the sensor;
and
an output to provide a first filtered signal based on the sensor signal;
a high-pass filter that includes:
an input coupled to the set of outputs of the sensor;
and
an output to provide a second filtered signal based on the sensor signal;
a comparator that includes:
a first input coupled to the output of the high-pass filter to receive the second filtered signal;
a threshold input to receive a threshold signal;
and
an output to provide a comparison signal based on the second filtered signal and the threshold signal;
and
a processor that includes:
an analog-to-digital converter that includes an input coupled to the output of the low-pass filter and that includes an output;
and
an event counter that includes an input coupled to the output of the comparator and that includes an output;
a digital signal processor that includes an input coupled to the output of the analog-to-digital converter and that includes an output;
and
a processing resource that includes:
a first input coupled to the output of the event counter;
a second input coupled to the output of the digital signal processor;
and
an output configured to provide a fault signal based on the output of the event counter and the output of the digital signal processor.

23 more elements

A system comprising:

a time-domain analyzer that includes an input configured to couple to a sensor to receive a sensor signal in response to power through a line, wherein:
the power through the line has a fundamental frequency;
and
the time-domain analyzer includes an output to provide a count of a number of events in the sensor signal that have a respective frequency greater than the fundamental frequency;
a frequency-domain analyzer that includes:
an input configured to couple to the sensor to receive the sensor signal;
and
an output to provide a frequency-domain signal based on the sensor signal;
and
a processing resource that includes:
a signature library;
a first input coupled to the output of the time-domain analyzer to receive the count of the number of events;
a second input coupled to the output of the frequency-domain analyzer to receive the frequency-domain signal;
and
an output to provide a fault signal in response to a comparison of the signature library to the count of the number of events and the frequency-domain signal.

12 more elements

Dependencies are inferred from the claim text.

Facts

Application: 16/743,123Filed 15 Jan 2020 · continuation
Priority: 16 Dec 2016
Published: US 2020/0150192 A114 May 2020
Granted: 6 Oct 2020
Term ends: Not estimatedThe source records don’t support an estimate.

Classification6 codes

G01R 31/58
Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections: testing…
G01R 19/2513
Using digital measurement techniques: arrangements for monitoring electric power systems, e.g. power lines or loads; Logging
G01R 31/08
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by…
G01R 31/2612
For testing bipolar transistors: for measuring frequency response characteristics, e.g. cut-off frequency thereof

Family

Application62/435,621Us provisional application · filed 16 Dec 2016
Application15/844,235Parent of this continuation · filed 15 Dec 2017
Application16/520,518Parent of this continuation · filed 24 Jul 2019
US 10,401,412 B2Parent of this continuation · filed 3 Sep 2019
US 2020/0150192 A1Pre-grant publication · published 14 May 2020
US 10,564,206 B2Parent of this continuation
US 2018/0172750 A1Published application
US 2019/0346499 A1Published application
US 10,794,963 B2This patent

From the US filing history. Foreign family members aren’t listed.