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US 10,794,782 B2Granted
Systems and methods of measuring torsional resistance in a hinge
AssigneeMicrosoft Technology Licensing, LLC
InventorsErrol Mark Tazbaz, Luis Ariel Aldarondo
Life of this patent
Estimating the term…
Abstract
A measurement device includes a probe having a first conductive surface, a second conductive surface, and an insulating layer. The second conductive surface is opposite the first conductive surface and fixed relative to the first conductive surface. The insulating layer is positioned between the first conductive surface and second conductive surface and electrically insulates the first conductive surface from the second conductive surface.
Claims22
A measurement device comprising:
- a first probe having a first conductive surface, a second conductive surface opposite the first conductive surface and fixed relative to the first conductive surface, and an insulating layer positioned between the first conductive surface and second conductive surface and electrically insulating the first conductive surface from the second conductive surface;
- and
- a second probe in electrical communication with the first probe and configured to generate a contact signal upon contact with a third contact point, where a first contact point, a second contact point, and the third contact point are in the same plane.
A measurement system comprising:
- a first probe having:
- a first side,
- a second side opposite the first side and fixed relative to the first side, and
- wherein the first side has a first sensing surface configured to generate a first contact signal upon contact with a first contact point, and the second side has a second sensing surface configured to generate a second contact signal upon contact with a second contact point;
- a second probe configured to generate a third contact signal upon contact with a third contact point, where the first contact point, the second contact point, and the third contact point are in the same plane;
- a first support attached to and supporting the first probe;
- and
- a second support attached to and supporting the second probe, the second support being movable relative to the first support.
5 more elements
A method for measuring an inner space, the method comprising:
- positioning a first probe in the inner space;
- contacting an inner surface of the inner space with a first sensing surface of the first probe;
- contacting the inner surface of the inner space with a second sensing surface of the first probe while the first sensing surface remains in contact with the inner surface of the inner space;
- contacting the inner surface of the inner space with a second probe while the first sensing surface and second sensing surface remain in contact with the inner surface of the inner space;
- and
- measuring a first position of the first probe relative to a second position of the second probe to define a planar distance between the first position of the first probe and the second position of the second probe.
3 more elements
Dependencies are inferred from the claim text.