# US 10,771,087 B2 ยท Methods, devices and systems for data conversion > Agents: this data is available as JSON from the patentgrep API and MCP server โ€” see https://patentgrep.com/llms.txt - Number: US 10,771,087 B2 - Document ID: US10771087B2 - Status: Granted - Kind: B2 - Application number: 16/424,984 - Filed: 2019-05-29 - Published: 2019-12-19 - Granted: 2020-09-08 - Earliest claimed: 2018-06-13 - Assignees: Infineon Technologies AG - Applicants: Infineon Technologies AG - Inventors: Jochen O. Schrattenecker; Peter Bogner; Andrea Cristofoli; Michael Kropfitsch - Web page: https://patentgrep.com/patent/US10771087B2 ## CPC - H03M 1/1071: {Measuring or testing} - H03M 1/84: Non-linear conversion - H03M 1/1033: {over the full range of the converter, e.g. for correcting differential non-linearity} - H03M 1/367: {Non-linear conversion} - H03M 1/464: {Non-linear conversion} - H03M 1/12: Analogue/digital converters ({H03M1/001 โ€“ } H03M1/10 take precedence) - H03M 1/66: Digital/analogue converters ({H03M1/001 โ€“ } H03M1/10 take precedence) - H03M: CODING; DECODING; CODE CONVERSION IN GENERAL (using fluidic means F15C4/00; optical analogue/digital converters G02F7/00; coding, decoding or code conversion, specially adapted for particular applications, see the relevant subclasses, e.g. G01D, G01R, G06F, G06T, G09G, G10L, G11B, G11C, H04B, H04L, H04M, H04N; ciphering or deciphering for cryptography or other purposes involving the need for secrecy G09C) ## Abstract In accordance with an embodiment, a method of monitoring a data converter includes determining a multiplicity of time-associated linearity parameters that describe a linearity of the data converter at a multiplicity of different times, and determining a state of the data converter based on comparing at least one linearity parameter of the multiplicity of time-associated linearity parameters with a comparison parameter. ## Claims ### Claim 1 A method for monitoring a data converter, the method comprising: determining a multiplicity of time-associated linearity parameters that describe a linearity of the data converter at a multiplicity of different times, and determining a state of the data converter based on comparing at least one linearity parameter of the multiplicity of time-associated linearity parameters with a comparison parameter. ### Claim 2 (depends on 1) The method as claimed in claim 1, wherein the comparison parameter comprises a threshold value. ### Claim 3 (depends on 1) The method as claimed in claim 1, wherein the comparison parameter comprises at least one further time-associated linearity parameter of the multiplicity of time-associated linearity parameters. ### Claim 4 (depends on 1) The method as claimed in claim 1, wherein the at least one linearity parameter comprises at least one of: an integral non-linearity (INL); a differential non-linearity (DNL); an offset error; a missing bit position; or a gain error. ### Claim 5 (depends on 1) The method as claimed in claim 1, wherein determining the multiplicity of time-associated linearity parameters comprises converting a predefined test signal using the data converter and detecting the converted predefined test signal. ### Claim 6 (depends on 5) The method as claimed in claim 5, wherein the predefined test signal comprises only a portion of an input range of the data converter, wherein the portion of the input range comprises a range of a design-specific maximum non-linearity. ### Claim 7 (depends on 6) The method as claimed in claim 6, wherein the data converter comprises an analog-to-digital converter having at least two analog-to-digital converter states, and the portion of the input range comprised by the predefined test signal comprises a transition range between the at least two analog-to-digital converter states. ### Claim 8 (depends on 6) The method as claimed in claim 6, wherein: the data converter is a pipeline analog-to-digital converter comprising a multiplicity of converter stages, wherein each converter stage of the converter stages has a respective conversion range that is, in each case, at least partly different from one another; and the portion of the input range comprised by the predefined test signal includes the respective conversion ranges of at least two of the converter stages. ### Claim 9 (depends on 6) The method as claimed in claim 6, wherein the data converter is a successive approximation analog-to-digital converter, and wherein the range of the design-specific maximum non-linearity comprises a value range involving switching of a most significant bit, MSB, or a second most significant bit, MSB-1. ### Claim 10 (depends on 1) The method as claimed in claim 1, wherein the at least one linearity parameter or the comparison parameter is defined as a function of at least one ambient parameter. ### Claim 11 (depends on 1) The method as claimed in claim 1, further comprising: determining an operating point of the data converter; and determining a correctness of an operating point state of the data converter based on a comparison of the operating point with at least one third value, wherein determining the multiplicity of time-associated linearity parameters and determining the state of the data converter are only carried out if the correctness is present. ### Claim 12 A device for data conversion, comprising: a data converter; a test signal circuit configured to determine a multiplicity of time-associated linearity parameters that describe a linearity of the data converter, at a multiplicity of different times; and a monitoring circuit configured to determine a state of the data converter based on comparing at least one linearity parameter of the multiplicity of time-associated linearity parameters with a comparison parameter. ### Claim 13 (depends on 12) The device for data conversion as claimed in claim 12, further comprising: a signal interface configured to provide at least one signal based on the state of the data converter; and a shutdown circuit configured to shut down the data converter based on the state of the data converter. ### Claim 14 (depends on 12) The device for data conversion as claimed in claim 12, wherein: the monitoring circuit is configured to determine an operating point of the data converter, and determine whether the operating point of the data converter is correct based on a comparison of the operating point with at least one third value; and the determining the multiplicity of time-associated linearity parameters and the determining the state of the data converter are only performed if the operating point is determined to be correct. ### Claim 15 (depends on 12) The device for data conversion as claimed in claim 12, wherein: the test signal circuit is configured to provide a predefined test signal; the predefined test signal comprises only a portion of an input range of the data converter, wherein the portion of the input range comprises a range of a design-specific maximum non-linearity; and the data converter is configured to convert the predefined test signal to a converted test signal. ### Claim 16 (depends on 15) The device for data conversion as claimed in claim 15, wherein the data converter is a pipeline analog-to-digital converter comprising a multiplicity of converter stages, wherein each converter stage of the converter stages has a respective conversion range that is, in each case, at least partly different from one another; and the portion of the input range comprised by the predefined test signal includes the respective conversion ranges of at least two of the converter stages. ### Claim 17 (depends on 15) The device for data conversion as claimed in claim 15, wherein the data converter is a successive approximation analog-to-digital converter, and wherein the range of design-specific maximum non-linearity comprises a value range involving switching of a most significant bit, MSB, or a second most significant bit, MSB-1. ### Claim 18 A method, comprising: generating a predefined test signal; converting the predefined test signal using an analog-to-digital converter to generate a converted test signal; determining a multiplicity of time-associated linearity parameters that describe a linearity of the analog-to-digital converter at a multiplicity of different times based on the converted test signal; and comparing at least one linearity parameter of the multiplicity of time-associated linearity parameters with a comparison parameter; and determining a state of the analog-to-digital converter based on the comparing. ### Claim 19 (depends on 18) The method of claim 18, wherein the predefined test signal comprises only a portion of an input range of the analog-to-digital converter, and the portion of the input range comprises a range of a design-specific maximum non-linearity. ### Claim 20 (depends on 18) The method of claim 18, further comprising shutting down the analog-to-digital converter based on the determined state.